Сканирующее щелевое профилирование пучка с NanoScan

NanoScan™ - наивысшее качество измерений.
Преимущество сканирующего щелевого профилирования состоит в субмикронной точности измерений размера луча в соответствии с эталонами NIST. Доступны кремниевые, германиевые и пироэлектрические сканирующие головки для широкого диапазона длин волн и уровней мощности лазера. Предлагается две версии программного обеспечения - стандартная и профессиональная. Программное обеспечение включает в себя широкий набор измерений ISO, приложение M2 и функцию измерения мощности лазера.

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Scanning Slit Beam Profiler For High Accuracy Dimensional Measurement
 
NanoScan 2s combines the convenience and portability of direct USB connectivity with the speed, accuracy, and dynamic range that users have come to expect from the Photon NanoScan slit based profilers. The NanoScan 2s is available with a silicon, germanium or pyroelectric detector, which allows it to profile lasers of any wavelength from UV to far infrared, out to 100μm and beyond. With the new NanoScan 2s software package, the user can configure the display interface however it is desired; displaying those results of most interest on one easy-to-read screen, or on multiple screens.
The NanoScan slit profiler is the most versatile laser beam profiling instrument available today: providing instantaneous feedback of beam parameters for CW and kilohertz pulsed lasers, with measurement update rates to 20Hz. The natural attenuation provided by the slit allows the measurement of many beams with little or no additional attenuation. The high dynamic range makes it possible to measure beams while adjustments to focus are made without having to adjust the profiler. Just aim the laser into the aperture and the system does the rest!		 Scanning Slit Beam Profiler

Capabilities
NanoScan 2s is a PC-based instrument for the measurement and analysis of laser beam spatial irradiance profiles in accordance with the ISO standard 11146. The scan heads also measure power in accordance with ISO 13694. NanoScan uses the scanning slit, one of the ISO Standard scanning aperture techniques. It can measure beam sizes from microns to centimeters at beam powers from microwatts to over kilowatts, often without attenuation. Detector options allow measurement at wavelengths from the ultraviolet to the infrared.
The NanoScan 2s digital controller has 16-bit digitization of the signal for enhanced dynamic range up to 35dB power optical. With the accuracy and stability of the beam profile measurement you can measure beam size and beam pointing with a 3-sigma precision of several hundred nanometers. The software controllable scan speed and a "peak-connect" algorithm allows the measurement of pulsed and pulse width modulated lasers with frequencies of 10kHz and higher*. The NanoScan is also able to measure up to 16 beams, or regions of interest, in the aperture simultaneously.

Benefits
 Measure any wavelength from UV to very far infrared (190nm to >100μm)
 Instantaneous real time display of results; beam found in less than 300ms and updated at up to 20Hz
 Waist location can be determined to within ±25μm due to the well-defined Z-axis datum plane of the NanoScan
 Measure pulsed and CW lasers
 For pulsed beams the pulse rate is measured and reported
 From as small as 7μm beams, can be measured directly with guaranteed accuracy and precision
 Additional high signal to noise ratio can be achieved with averaging
 Z-axis caustic measurements are available with built-in mechanical linear stage control
 M2 propagation ratio values available with simple M2 Wizard included with the software.
 Any beam result can be charted and monitored over time
 Power levels can be monitored along with spatial measurements to determine if losses are introduced by beam adjustments
 Log results to text files for independent analysis
 Automate the system using optional ActiveX Automation commands, available with the PRO version software and scan heads
 Samples of automation programs included for Excel, VBA, LabView and Visual Basic.net
* The minimum frequency is a function of the beam size and the scan speed. This is a simple arithmetic relationship; there must be a sufficient number of pulses during the time that the slits sweep through the beam to generate a meaningful profile. Please refer to Photon's Application Note, Measuring Pulsed Beams with a Slit-Based Profiler.

NanoScan 2s Configurable User Interface
In addition to new hardware, the NanoScan 2s has an updated integrated software package for the Microsoft Windows Platform, which allows the user to display any of the results windows on one screen. The NanoScan 2s software comes in two versions, STD and PRO. The NanoScan 2s Pro version includes ActiveX automation for users who want to integrate the NanoScan into OEM systems or create their own user interface screens with C++, LabView, Excel or other OEM software packages.
NanoScan 2s Configurable User Interface

See Your Beam As Never Before
The new NanoScan 2s graphical user interface (GUI) allows the user to set the display screens to any appropriate configuration, displaying those that are of interest and hiding what is not. This means that you can have the information that you want to see, uncluttered by extraneous output, and you can have all the features you need, visible at once. The screens can be docked or floating with ribbon bars for the controls that can be visible or hidden as desired. This allows you to take advantage of a large, multi-monitor desk top or maximize the useful information on a small laptop display.
See Your Beam As Never Before

Integrated Power Meter
The silicon and germanium detector equipped NanoScan 2s systems include an integrated 200mW power meter.
The scanhead comes with a quartz attenuator window that provides a uniform response across a broad wavelength range.
This is a relative power meter that has better than 1.5% correspondence when calibrated with a user-supplied power meter and used in the same configuration as calibrated.
The power meter screen in the software shows both the total power and the individual power in each of the beams being measured.		 Integrated Power Meter

Available Detectors
The NanoScan 2s is available with silicon, germanium or pyroelectric detectors to cover the light spectrum from UV to very far infrared.

Apertures and Slits
The NanoScan 2s is available with a variety of apertures and slit sizes to allow for the accurate measurement of varying beam sizes. The slit width defines the minimum beam width that can be measured; due to convolution error, the slit should be no larger than ¼ the beam diameter to provide a ±3% accurate measurement. For this reason the minimum beam diameter measureable with the standard 5μm slit is 20μm. To measure beams smaller than 20μm it is necessary to use the small aperture 1.8μm slit instrument, providing a minimum beam diameter of ~8μm. Because these slits are so narrow, the maximum length limits the aperture to 3.5mm. Contrary to many people's beliefs, these smaller slits do not improve the resolution of the measurement, only the minimum size of the beam. Therefore, unless it is necessary to measure beams less than 20μm, one would be advised to stick with the 9mm/5μm configurations.

The Most Versatile and Flexible Beam Profiling System Available
With the available range of detectors, slit sizes and apertures the NanoScan 2s provides the maximum versatility in laser beam profiling. NanoScan 2s adds the convenience and portability of direct USB connectivity: no external controllers or power supplies required to operate the profiler. In addition the rotation mount has been redesigned to provide a stand for vertical operation, if desired. The mount can be positioned in one of two places. If vertical operation is desired the mount is positioned toward the back of the scanhead to expose the stand, which can be affixed to the optical table or stage. If standard horizontal operation is desired, then the rotation mount can be positioned in the forward configuration, maintaining the original length and size of the scanhead.

The Most Versatile and Flexible Beam Profiling System Available

For Higher Powers, Teams up the NanoScan with the LBS-300s
In order to measure powers and energies above the limits of the NanoScan, an LBS-300s of the appropriate wavelength rang can be attached to the front of the NanoScan and measure powers up to 1000W and more.
The C mount thread of the LBS-300s mates with the C mount thread of the NanoScan. There are various models of the LBS-300s ranging in wavelength from 190nm up to 1550nm and beyond. Alternatively, the Stackable Beam Splitters can be attached to the NanoScan and used to attenuate high power beams.

For Higher Powers, Teams up the NanoScan with the LBS-300s

Measured Beam Results
From 1989 through 1996, John Fleischer, founder and past President of Photon Inc., chaired the working laser beam width ISO/DIN committee that resulted in the ISO/DIN 11146 standard. The final approved standard, available in 13 languages. The standard governs profile measurements and analysis using scanning apertures, variable apertures, area sensors and detector arrays. NanoScan 2s measures spatial beam irradiance profiles using scanning slit techniques.
Results measured include:
Beam Width at standard and user-definable clip levels, including 1/e² and 4σ
Centroid Position
Peak Position
Ellipticity
Gaussian Fit
Beam Divergence
Beam Separation
Pointing Stability
ROI Power
Total Power
Pulsed Laser Repetition Rate
Measured Beam Results

M² Wizard
M-squared (M²) software Wizard is an interactive program for determining the “times diffraction limit” factor M² by the Rayleigh Method. The M² Wizard prompts and guides the user through a series of manual measurements and data entries required for calculating M². Used with a user-provided translation stage focusing lens and the M² Wizard in the NanoScan Analysis Software, the user can quickly and easily determine the times-diffraction propagation factor (M²) of a laser. For automated and automatic M² measurements the NanoModeScan option is required.

Pulsed Laser Beam Profiling
In addition to profiling CW laser beams, NanoScan can also profile pulsed laser beams with repetition rate in the 10kHz range and above. To enable the measurement of these pulsed lasers, the NanoScan profiler incorporates a "peak connect" algorithm and softwarecontrolled variable scan speed on all scanheads. The accuracy of the measurement generally depends on the laser beam spot size and the pulse-to-pulse repeatability of the laser. The NanoScan is ideal for measuring Q-switched lasers and lasers operating with pulse width modulation power (PWM) control. In the past few years, lasers with pico- and femtosecond pulse durations have begun to be used in many applications. Although these lasers add some additional complication to the measurement techniques, the NanoScan can also measure this class of laser.

 

NanoScan 2s Acquisition and Analysis Software

 

Use the Software specification from the existing NanoScan 2s data sheet
*FeatureNanoScan StandardNanoScan Professional (all features in Standard plus)
Controls
SourceScanHead Select, Gain, Filter, Sampling Resolution, AutoFind, Rotation Frequency, Record Mode
CaptureAveraging, Rotation, Magnification, CW or Pulse Modes, Divergence, Gaussian Fit, Reference Position, Recompute
Regions of Interest (ROI)Single or Multiple, Automatic or Manual, Colors
ProfilesVertical Scale (1´, 10´, 100´), Logarithmic Scale, Z & PAN (Automatic or Manual)
Computation: ISO 13694, ISO 11146Dslit, (13.5%, 50% 2 User Selectable Clip Levels), D4Ó, Width ratios, Centroid Position, Peak Position, Centroid Separation, Peak Separation, Irradiance, Gaussian Fit, Ellipticity, Divergence, Total Power, Pulse Frequency, % power
 Continuous, Rolling, Finite
PointingCentroid or Peak, Accumulate Mode, Beam Indicator, Graph Center, Colors
2D/3D2D or 3D Mode, Linear or Logarithmic Scale, Resolution, Fill Contours, Solid Surface, or Wireframe, Clip Level Colors
ChartsChart Select, Parameter Select, Aperture Select, Update Rate, Start and Clear
LoggingFile Path/Name, Delimiter, Update Rate
M²Rail Setup: Com Port and Length, Connect/Disconnect, Rail Control
Views
ProfilesDisplays Beam Profiles for each axis, with optional Gaussian Overlays
ResultsDisplays Values and Statistics for Selected results
PointingDisplays the XY position of the Centroid or Peak for each ROI , with optional overlays and Accumulate Mode
ChartsDisplays Time Charts for User-selected results
2D/3DDisplays pseudo 2D/3D Beam Profile
M²Wizard An interactive procedure for measuring M² by the Rayleigh Method
File Saving
NanoScan Data Files
Text Files
Data Logging
Log to File
Reports
NanoScan Report
Automation Interface
ActiveX Automation Server 
Minimum System Requirements
PC computer running windows 7 (32/64) Laptop or Desktop¹  
A dual core processor CPU, 2GHz or better  
2GB of RAM²  
1-USB 2.0 port available  
At least 250MB of free HDD space  
1400 x 900 display resolution or better  
Graphics card w/hardware accelerator  
DVD-ROM drive  
Microsoft compatible pointing devices(e.g., mouse, trackball, etc)  
*Download the NanoScan Acquisition and Analysis Software Manual for a complete description of all Software Features

 

Professional Version Automation Interface

For customer who want to incorporate the NanoScan 2s into an automated procedure or to create a customized user interface, the PRO version scanheads include an ActiveX Automation Server that can be used by an Automation Client written in Visual Basic for Applications (VBA), C/C++ or by an application which supports ActiveX Automation, such as Microsoft Excel, Microsoft Word or National Instruments' LabVIEW. The software package include example of programs written in Excel and LabVIEW in the automation folder.
 

Specifications

ModelSi/3.5/1.8μmSi/9/5μmGe/3.5/1.8μmGe/9/5μmPyro/9/5μm
Wavelengths190-1100nm(1)190-1100nm(1)700-1800nm700-1800nm190-100μm
Slit Size1.8μm5μm1.8μm5μm5μm
Aperture size3.5mm9mm3.5mm9mm9mm
1/e² Beam diameter range7μm-~2.3mm20μm-~6mm7μm-~2.3mm20μm-~6mm20μm-~6mm
Spatial sampling resolution5.3nm-18.3μm
Scan frequency1.25, 2.5, 5, 10, 20Hz
Power readingUser calibrated
Power aperture windowMetalized Quartz (200mW upper limit)N/A
Laser typeCW or Pulsed
Operating rangeSee Operating Space Charts
Damage thresholdSee Operating Space Charts
Rotation mountStandard
Bus interfaceUSB 2.0
OS supportedWindows 7 (64) and Windows 10
Signal digitization16bit
Maximum digitization clock21.4MHz
Maximum update rate20Hz
Data transferBulk Transfer Mode
On-board memory64MB mDDR SDRAM
Weight434g (15.3 ounces)
Operating temperature0-50ºC
Humidity90%, non-condensing
Scanhead dimensions76.8mm L x 63.5mm Ø
PowerUSB 2.0 Bus Powered
CPU clock300MHz
Memory clock264MHz
Scanning motorBrushed DC, 4W max
ComplianceCE, UKCA, China RoHS
Note:(¹) Between 950nm and 1100nm, there might be a degradation of system performance
 
 

Typical NanoScan Operating Space Charts

Operating Range is at Peak Sensitivity of Detector. Operating Space is NOT absolute.
THESE CHARTS TO BE USED AS A GUIDE ONLY.
Silicon Detector

Silicon Detector

Silicon Detector: Responsivity varies with wavelength. Detects between 190-950nm. Peak responsivity is 0.4 amps/watt at 850nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1)/ contact the factory.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyrodetectors are not blackened.
Slit Damage ( ): where one can begin to cut the slits. Refer to Photon's Damage Threshold with High Power Laser Measurements document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.
Germanium Detector

Germanium Detector

Responsivity: Detector conversion constant, incident photons to a current.
Detector: Responsivity varies with wavelength. Detects between 700-1800nm. Peak responsivity is 0.7 amps/watt at 1550nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1) contact the factory.
Beam Diameter: Circular laser spot being measured by a narrow slit. Clip level method.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyro detectors are not blackened.
Slit Damage ( ): Power density (watts/cm2) where one can begin to cut the slits. Refer to Photon's Aperture Damage due to High Incident Power document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.
Pyroelectric / 9mm / 5μm

Pyroelectric / 9mm / 5μm

Responsivity: Detector conversion constant, incident photons to a current.
Detector: Responsivity varies with wavelength. Detects between 700-1800nm. Peak responsivity is 0.7 amps/watt at 1550nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1) contact the factory.
Beam Diameter: Circular laser spot being measured by a narrow slit. Clip level method.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyro detectors are not blackened.
Slit Damage ( ): Power density (watts/cm2) where one can begin to cut the slits. Refer to Photon's Aperture Damage due to High Incident Power document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.

 

  • Download NanoScan Standard
    NanoScan Standard is our full-function software with a extensive set of NIST traceable ISO beam width and roundness, beam position, and M2 measurements and a customizable user interface with the ease-of-use and flexibility that customers have come to expect.
  • Download NanoScan Professional
    NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.