Laser Beam Analysis

Catalog

Details on all of our laser measurement instruments.

Catalog

A laser beam profiler will increase your chance of success anytime you wish to design or apply a laser or when you find your laser system is no longer meeting specifications. You would …

Technical Article

Reducing Production Waste with Laser Profiling

A laser profiling system can be of great benefit in helping to characterize and identify which variables affect product quality and waste minimization.

Technical Note

Total Optical Path Length with Beam Splitters on 4.5 mm Recessed CCD Cameras

Often we get requests for the Total Optical Path Length when beam splitters are used on our line of 4.5 mm recessed CCD cameras.

Technical Article

Reimaging UV Laser Beam Profiling

Ophir Photonics offers a number of solutions for profiling UV laser beams. Spot sizes from 0.15 mm to over 25 mm can be safely profiled without the risk of camera sensor damage or …

Technical Note

Finding the Center of the NanoScan

The center of the NanoScan can be found by the following steps.

Technical Note

How to Set BeamGage to Lock Out Making Changes to Settings Inadvertently

BeamGage has the ability to lock out the ability to make changes to the settings in case you inadvertently change something you shouldn't have, or if you want to lock out operators …

Technical Note

Care of NanoScan Apertures

The NanoScan slit and pinhole aperture substrates are very thin and extremely fragile. Any physical contact will likely damage them. For example, fiber tips placed too close to the …

Software

Laser Beam Analysis Software

Our laser beam analysis software performs rigorous data analyses on key laser parameters.

Technical Note

Interconnecting Ophir Products and Accessories

Ophir provides mutual interconnections between different Ophir products via adapters with various threads, designed to exactly fit required optical path distances for each device.

Technical Article

Rayleigh Scatter, and Adhering to ISO 11146

This document is intended to show how the process of obtaining data and providing measurements using Ophir-Spiricon’s Rayleigh-scatter beam profiling technology, BeamWatch®, aligns …

Technical Article

Overcoming the Challenges of Measuring High Power NIR Lasers

High power laser application has significantly increased in recent years due to new production techniques that enable cheaper manufacturing and operating costs. Applications of high-power …

Technical Article

Quality Assurance in Additive Manufacturing

Whether in research or in production, the laser parameters must be checked regularly. For this purpose, Fraunhofer IAPT generally turns to the Ophir BeamWatch AM, which measures the …

Technical Article

University Research Team Faces Challenges of Measuring Multiple Lasers

The scientific community is often faced with the requirement of testing, validating, or merely qualifying several laser sources planned for a particular project.

Technical Article

Characterizing a Laser Used in Metal Additive Manufacturing Equipment

A developer of power-bed additive manufacturing systems needed a beam profiling system that could be used by their field technicians for setup and maintenance of customers’ lasers.

Technical Article

Scanning Slit vs Camera-Based Beam Analyzers

In part 1, we discussed camera technologies that are available for covering various wavelengths. There are similar options for scanning slit profilers.

Technical Note

NanoModeScan: Which Scan Heads Not to Use

We do not recommend using the smallest scan heads (3.5 mm aperture, 1.8 μm slit) for M2 measurement, because they are subject to a distortion effect called vignetting: Scanning slits …

Technical Note

The Focal Length Divergence Measurement Method

The Focal Length Divergence measurement method is based upon the beam width of a focused beam’s spot size and the focal length of the focusing optic.

Technical Note

Why You Should Not Use Image Files For Data Analysis

Image logging and export formats in BeamGage are intended for use as easily created screenshots for reports and presentations. Alternatively there are real data formats for use in mathematical …

Technical Note

BeamGage Professional Partitions with Multiple Beams on One Display

The Partition feature, available in BeamGage Professional, allows subdividing the camera imager into separate regions, called partitions, and which can then compute separate beam results …

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