SP920s-1550 Beam Profiling Camera

SP920s-1550 Beam Profiling Camera

USB 3.0 Phosphor Coated Silicon CCD High Resolution Camera with BeamGage
 
概要: 

The phosphor-coated SP920s camera accurately captures and analyzes wavelengths from 1440nm - 1605nm with improved accuracy in the NIR. It features a compact design, wide dynamic range, excellent signal to noise ratio, and built-in pre-triggering circuitry that makes it ideal for measuring CW and pulsed laser profiles or for telecom mode field analysis.

  • 5.3mm x 7.1mm active area with an effective 60µm pixel pitch
  • 15 fps at full resolution
  • BeamGage Standard or Professional software included

仕様

  • 1440-1605nm
  • 600μm - 5.3mm
  • USB 3.0
  • Phosphor-Coated Silicon CCD
  • CW, Pulsed
  • 5.3mm x 7.1mm
  • 1624 x 1224
  • 60µm
  • ~30dB
  • 15 fps
  • CE, UKCA, China RoHS
ビームプロファイラの選定は ビームプロファイラ・ウィザードをご利用ください。

製品概要

The SP920s-1550 USB 3.0 phosphor coated silicon CCD high resolution camera is available with the following versions of software.

Learn more about the different versions of BeamGage

  • BGS-USB3-SP920s-1550

    SP90561

    BeamGage Standard software, software license, 1/1.8” format 1624 x 1224 pixel camera with 4.5mm C mount CCD recess. Phosphor coated to 1550 nm. Comes with USB cable and 3 ND filters

    御見積り
  • BGP-USB3-SP920s-1550

    SP90562

    BeamGage Professional software, software license, 1/1.8” format 1624 x 1224 pixel camera with 4.5mm C mount CCD recess. Phosphor coated to 1550 nm. Comes with USB cable and 3 ND filters

    御見積り
  • BGS TO BGP UPGRADE

    SP90233

    BeamGageスタンダード版からプロフェッショナル版へアップグレード。動作にはカメラキーが必要。

    御見積り
  • BeamGage StandardBeamGageスタンダード版
    レーザビーム解析用BeamGageビームゲージソフトウェア・スタンダード版は、数多くのISO規格に準拠した測定に対応、UtraCal™ ウルトラキャルアルゴリズム(特許取得済み)は業界で最も高い計測精度を誇ります。
  • BeamGage ProfessionalBeamGageプロフェッショナル版
    レーザビーム解析用BeamGageビームゲージソフトウェア・プロフェッショナル版は、スタンダード版の機能に追加機能が含まれています。全てのカメラに対応、ウインドウが仕切られて表示されるので1台のカメラでマルチビーム解析に対応、ユーザのアプリケーションに最適化できるよう.NETオートメーションインターフェースに対応しています。

FAQ

カメライメージ品質について

Camera Defects Policy
Ophir-Spiricon, LLC (OSL) is a supplier of laser beam analysis tools that employ commercial-industrial solid-state cameras. OSL attempts to supply cameras with as few pixel defects as possible. OSL tests for and corrects defective pixels that may have an adverse effect when used for its intended purpose. OSL does not guarantee that a supplied camera will be defect free, or that they will remain defect free during its normal lifetime and under normal use.

It is not uncommon for modern megapixel camera imagers to develop point defects as they age, even when not subjected to abuse. Imagers without windows often experience point defects at rates typically greater than imagers with their cover glass left in place. Point defects can also appear more frequently when operating at higher rather than lower ambient temperatures, and higher relative humidity. Such defects can occur even when the camera is in storage and not being used.

Cameras supplied by OSL will be certified for use in laser beam analyzer applications. When defects occur, the ability to make certain measurements under certain conditions may be compromised. However, depending upon the nature of the defect, most measurement can still be performed without loss of accuracy. In some instances the effects of defects can be eliminated or significantly reduced by adjusting the manner in which the camera is being employed.

Ophir-Spiricon, LLC offers a camera recertification service. This service can help to extend the useful life of your camera and correct some point defects that may show up over time. This service can not correct cameras with serious laser damage or imager degradation. Whenever possible OSL will restore the camera to our "as new" level of certification; and if not possible, we will indicate to the user how to avoid areas of the imager that may not perform to "as new" standards.

Defects, Solutions and Workarounds
The following list contains examples of typical camera point defects that may occur over time, and suggested methods of compensating for them if they are troublesome:

Defect type Description of the Problem Recommended Solution
See Note 1 below
Bright Pixel Pixels with this defect will indicate being illuminated even when no signal is present. These are the most troublesome when attempting to make accurate peak fluence and peak fluence location measurements because they represent a false signal. Most other measurements are not adversely affected by this type of defect. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships. See Note 1 below. Our QA department will often reject cameras if the pixel can not be corrected and it exceeds our acceptance criteria.
  1. Ultracal/baseline correction will subtract out the defective pixel.
  2. Reposition the camera to remove the defective pixel from the measurement region and employ a manual aperture to isolate the pixel from the area of interest.
  3. Return the camera to OSL to have the bad pixel corrected and the camera re-certified.
Twinkling Pixel This is an intermittent version of the Bright Pixel defect. These often appear as the camera warms up. May disappear if the camera is run in cooler environments. Usually predicts a pixel that will soon be a permanently bright pixel defect.

These are the hardest to detect and as such may get past our camera inspection process.

Same as above.

If returned to OSL to be corrected please send a full frame data file showing the pixel as it is malfunctioning. This will aid in our ability to find and fix it.

Dark Pixel Dark pixels have low responses compared to the amount of illumination that they receive. Isolated instances of these types of defects do not pose a serious beam analysis problem and they are generally not in need of correcting. This type of defect will not significantly impact a beam measurement result unless the beam is very very small and the defect falls inside of the beam profile. Reposition the camera to remove the defective pixel from the measurement region.
Dead Pixel Dead pixels have no response at all and may output a raw pixel value of zero (0) counts. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships. This type of pixel may create a warning message when performing Ultracal operations. Ignore the warning and proceed as in the Dark Pixel case described above.
Dark Clusters These dimmer than normal clusters involving about a dozen or fewer pixels are often caused by dust particles and can usually be removed by cleaning of the imager. Sometimes these can be very difficult to impossible to remove. In the latter case they are may be melted into imager

If this is the result of laser damage then imager replacement is the only solution.

These usually do not cause serious measurement problems and can be treated with the Dark Pixel workaround described above. They can sometimes be dislodged with very gentle puffs of dry air. If you return a camera to be re-certified we have a few special methods for cleaning these, but success is not 100% guaranteed.
Regions of non-uniform response When large areas of an imager yield reduced signal levels this usually indicates laser damage. Long term exposure to ultraviolet radiation or overexposure to high laser power or peak energies are common causes. This type of degradation is not repairable and either the camera or the camera imager must be replaced.



Note 1: The following camera models can be re-certified and can have bad pixels corrected:
GRAS20, SP620, L11058, L230, Pyrocam III, Xeva
Each of the above cameras will have a maximum number of pixels that can be corrected. Once this limit is exceeded the camera imager or the camera must be replaced in order to meet OSL "as new" certification standards. If a large cluster of defective pixels appear, then bad pixel correction may not be able to repair the defect. The following cameras do not have, or have very limited, bad pixel correction capabilities:
SCOR20, SP503, FX50, FX33, FX33HD 

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SP503UやSP620UカメラのROIについて

The initial release of the SP503U and SP620U cameras did not have the ROI feature enabled. Those cameras that do not have the ROI feature enabled will need to be returned for upgrading both hardware and firmware, and the latest version of software will need to be installed, which is available at;
https://www.ophiropt.com/laser-measurement-instruments/beam-profilers/se...

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動画

Video Series: BeamGage Tutorials Video Series: BeamGage Tutorials
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BeamMaker helps engineers, technicians, and researchers understand a beam's modal content by subtracting theoretically generated modes from real beam measurement data. Derive a perfect beam profile by specifying the mode, size, width, height, intensity, angle, and noise content - then comparing it to theoretically derived measurements. The end result is knowledge about how much the real beam varies from the desired beam.

Watch the BeamGage Tutuorials, including tips on handling your CCD camera, software install, introduction to the BeamGage user interface, the context-sensitive help system and user manual, customizing your reporting environment, and configuring BeamGage to display specific laser measurements.

Support

チュートリアル

同一条件での比較:レーザビームアプリケーションに最適なカメラ技術はどれですか?

1997年、 Spiricon Inc.,の創設者であるDr. Carlos Roundyはドイツミュンヘンでの第4回インターナショナルワークショップ(レーザ&オプティクス)で発表しました。 詳細を見る

新しいレーザを購入しましましたユーザの計測事例。

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Imaging UV light with CCD Cameras

Is it possible to image a UV laser with a Silicon Sensor CCD camera offered by Ophir-Spiricon? The answer is yes, but the direct UV light ablates Silicon CCD chips over time. The ablation is cumulative and depends on the intensity, the wavelength, and the duration of the light on the sensor. The best choice for imaging UV light without damage is to avoid directly imaging the beam on the CCD sensor by using an UV image converter... 詳細を見る

Understanding Dynamic Range…The Numbers Game

There is a fair amount of confusion caused by the reporting of dynamic range of beam profilers. The purpose of this applications note is to explain some of the terminology used in the discussion of this parameter by both Ophir- Spiricon and other suppliers of beam profilers. DefinitionDynamic Range is the ratio of the largest measurable signal to the smallest measurable signal. The smallest measurable signal is typically defined as that equal to the noise level, or alternatively the “Noise Equivalent Exposure” or that point where the Signal-to-noise ratio (SNR) is 1. To 詳細を見る

The Focal Length Divergence Measurement Method

The Focal Length Divergence measurement method is based upon the beam width of a focused beam’s spot size and the focal length of the focusing optic. The Focal Length Divergence method provides a means for finding the far-field beam divergence at any point in the beam propagation path. As shown below, the calculation performed by the BeamGage® software is quite simple; however the optical setup must be done with great care. 詳細を見る

Laser Beam Measurement Vocabulary

Wavelength: In physics, the wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats,[1] and the inverse of the spatial frequency. It is usually determined by considering the distance between consecutive corresponding points of the same phase, such as crests, troughs, or zero crossings and is a characteristic of both traveling waves and standing waves, as well as other spatial wave patterns.[2][3] Wavelength is commonly designated by the Greek letter lambda (λ)... 詳細を見る

White Paper – Beam Width Measurement Accuracy

Introduction 詳細を見る

White Paper – Apples to Apples: Which Camera Technologies Work Best for Beam Profiling Applications, Part 2: Baseline Methods and Mode Effects

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BeamGage Profiling with .Net Automation Interface and LabVIEW®

BeamGage Professional and BeamGage Enterprise version 5.7 are supported with Automation via .Net components. Both include a LabVIEW example that can be run with the LabVIEW Run-Time Engine that is provided with the BeamGage software CD or available for free download from National Instruments. 詳細を見る

アクセサリ

上記製品に対応するアクセサリを各種ご用意しております
  • Optical Camera Trigger
    オプティカル カメラトリガーはトリガ機能オプションで、カメラ本体に設定して外部オプティカルトリガーでパルスに同期します。 オプティカル カメラトリガーシステムの構成はオプティカル カメラトリガー本体とオプションのC-マウントアダプター
  • 個別のフィルタが3枚付属、ND1フィルタは赤色ハウジング(透過率~10%@可視光)、ND2フィルタは黒色ハウジング(透過率~1%)、ND3フィルタは緑色ハウジング(透過率~0.1%)。各フィルタは重ねることでき、干渉が起きないようにハウジングの中で小さいウェッジアングルのセットの組合せで使用可能。
  • LBS-300 Attenuator
    The LBS-300s beam splitter attachment for C-mount, CS-mount, or Ophir mount cameras allow you to measure laser beams with diameters up to 15mm and powers ranging from 10mW to ~400W(1). The beam sampler is designed so that the preferential polarization selection effect of a single wedge is cancelled out and the resulting beam image is polarization
  • 4X Beam Expander
    ビームエキスパンダーは、4.5mmイメージ後焦点スペーシングまたはCS(12.5mm)後焦点スペーシングのCマウントカメラに対応するよう設計。4xビームエキスパンダーは拡大望遠鏡でCCDに装着されたエキスパンダー端から8mmでイメージを4倍に拡大。
  • Stackable Prism Front-Surface Beam Samplers
    減衰用プリズム(プリズム・フロントサーフィスビームサンプラー)はCマウントでUVグレードの合成石をハウジング。ハイパワー/エネルギービームプロファイルアプリケーションの表面反射のサンプリングに使用。
  • Stackable Beam Splitters
    スタッカブル・ビームスプリッターは組み合わせが容易で最短の光路で設計。Ophir のおおよそのカメラに対応、Cマウントでその他のアッテネーターにも対応。 
  • Beam Tap I & II
    レーザービームアッテネーター。ブロードバンドとYAGレーザーに対応。