Press Releases

Press Release

MKS Announces Ophir® BeamWatch® Plus, Industry’s First Non-Contact Beam Profiler for High Power VIS and NIR Lasers

Andover, MA – June 27, 2023 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of enabling technologies that transform our world, has announced Ophir® BeamWatch® Plus

Press Release

MKS Announces Ophir® BeamPeek™ Software for Field Technicians, Easy-to-Use Laser Beam Analysis for Optimizing Additive Manufacturing Processes

Andover, MA – June 21, 2023 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of enabling technologies that transform our world, has announced the release of Ophir® BeamPeek™ …

Press Release

MKS Announces New Ophir® Large Beam Profiler with Small Pixel Size for Higher Resolution Measurement of Large and Divergent Beams

Andover, MA – September 13, 2022 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced

Press Release

MKS Announces Ophir® BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing

April 26, 2022 – MKS Instruments announced the Ophir® BeamPeek™, an integrated beam analysis and power measurement system for fast, accurate, real-time measurement of lasers in additive …

Press Release

New Ophir® CMOS Camera-Based Beam Profiler for 190-1100nm Wavelengths Features Improved Accuracy at NIR, Nd:YAG Wavelengths

January 31, 2022 – MKS Instruments announced the Ophir® SP932U USB 3.0 High Resolution Beam Profiler. The SP932U system is a compact, CMOS camera-based beam profiler for UV, VIS, NIR, …

Press Release

New Ophir® Laser Beam Propagation System Supports Long Rayleigh Length Lasers in Material Processing and Micromachining Applications

October 20, 2021 – MKS Instruments announced the newest version of Ophir® BeamSquared®, the company's M2 laser beam propagation system that helps users optimize laser performance.

Press Release

Ophir® BeamWatch® Integrated 500 Industrial Beam Characterization System Measures Critical Laser Parameters in Real-Time for Production Environments Using Long Focal Length Lasers

June 14, 2021 – MKS Instruments announced the Ophir® BeamWatch® Integrated 500 industrial beam characterization system, a fully automated, non-contact laser measurement system designed …