NanoScan 2s
NanoScan 2s
NanoScan 2s

NanoScan 2s Si/9/5

Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 5µm Slits
Description: 

This NanoScan scanning-slit profiling system accurately captures and analyzes wavelengths from 190nm - 1100nm with its Silicon detector. It features a slit size suitable for most beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of UV, Visible, and NIR lasers.

  • Beam Sizes of 20µm to ~6mm
  • Power Levels of ~10nW to ~10W
  • USB 2.0 Interface
  • NanoScan Standard or Professional software included

Specification

  • 190-1100nm
  • 20μm - ~6mm
  • USB 2.0
  • Silicon
  • CW, Pulsed >25kHz
  • ~10nW - ~10W
  • 5µm
  • 9mm
  • 83mm
  • CE, China RoHS
Need help finding the right beam profiler? Try our Beam Profiler Wizard

Ordering

The Silicon NanoScans are available with the following versions of software. CLICK HERE for more information on the different versions of NanoScan software.

  • NS2s-Si/9/5-STD

    PH00457

    NanoScan2s Si Detector 9mm aperture 5µm slits. High-resolution head featuring Si detector, 63.5mm diameter head with rotation mount, 9mm entrance aperture, and matched pair of 5 µm wide slits. Use for wavelengths 190nm to 1.1µm.

    Request a Quote
  • NS2s-Si/9/5-PRO

    PH00465

    NanoScan2s Si Detector 9mm aperture 5µm slits. High-resolution head featuring Si detector, 63.5mm diameter head with rotation mount, 9mm entrance aperture, and matched pair of 5 µm wide slits. Use for wavelengths 190nm to 1.1µm. Software includes ActiveX automation feature

    Request a Quote
  • NSv2 STD to NSv2 PRO Software Upgrade

    PH00417

    Upgrade NanoScan v2 Standard version software to the PRO version. This upgrade opens the NanoScan automation feature for those users wanting to integrate or develop their own interface using Visual Basic for Applications to embed into such applications as LabView. Return scanhead to factory.

    Request a Quote
  • Download NanoScan Standard
    NanoScan Standard is our full-function software with a extensive set of NIST traceable ISO beam width and roundness, beam position, and M2 measurements and a customizable under interface with the ease-of-use and flexibility that customers have come to expect.
  • Download NanoScan Professional
    NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.

Drawings

FAQ

Where is the detector in the NanoScan?

The detector is mounted internal to the NanoScan behind the rotating slits. This position is not important to the measurements. The measurement plane is the scan plane of the slits, which is nominally 0.74mm +/-0.025 mm from the Reference Surface on the front of the NanoScan. Please refer to the mechanical drawings in Appendix B of the NanoScan Operational Manual.

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Why is the silicon NanoScan not recommended for 1064nm beam measurements?

The silicon detector is very transparent to NIR light >1000nm. If it is used for measuring these beams, you will often see a tailing profile, because the signal does not decay fast enough. This will lead to erroneous results. We recommend using the germanium, or if there is enough power, the pyro electric detector for these wavelengths.

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After setting up the NanoScan profiler and acquiring the beam, the profile is bouncing back and forth.

This is usually caused by the Automatic ROI selection. After acquiring the beam, you should then uncheck the Auto ROI in the ROIs menu and the beam should stabilize.

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Won't the NanoScan slit diffract the beam?

Yes, but since the NanoScan measures all the light on the detector as a function of slit position, this does not affect the measurement results.

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Can I get closer to the front of the NanoScan V2 since it has a new C-Mount adapter ring?

The NanoScan V2 product is great for looking at focused spots, but sometimes the C-Mount ring that is on the front can get in the way mechanically. By removing the three retaining screws it will allow you to remove this ring so you can get mechanically closer to the front of the NanoScan V2. Care should be used when removing these screws and the ring so something does not fall down inside the input aperture of the NanoScan V2. It is recommended that if you are going to remove the C-Mount ring that you invert the NanoScan V2 so it is looking at the floor and then remove the screws and the C-Mount ring to allow gravity to work in your favor and pull them away from the input aperture.

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My NanoScan system is giving me an error that says” The selected speed could not be set within 0.01%!” What does this mean?

This means that the motor is not able to set the rotation speed to within 0.01% precision. This typically means that the motor is wearing out, or that something is causing the motor to not be able to rotate at a constant speed. This typically requires that the system come back to the factory for inspection and repair.

This could also mean that you are running the wrong software. If the NanoScan does not have a Mini USB connection on the head, it should not be run on NanoScan 2.4.X software. It should be run on version 2.1 SR1 software.

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Can multiple NanoScans be run from the same PC, or can you connect multiple NanoScans and select the one you want to run?

Actually, only one NanoScan can be run from the NanoScan software at a time. If you did connect multiple NanoScans, only one will be recognized and able to run, and the other(s) will not be selectable.

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Videos

Using the NanoScan Slit Profiler Using the NanoScan Slit Profiler
Why Measure Your Laser Beam? Why Measure Your Laser Beam? Why Measure Your Laser Beam?

This tutorial is presented by Ophir-Spiricon sales engineers - the experts in the field of measuring lasers and in helping you get the most out of your laser beam.

Fundamentals of Laser Measurement & Beam Profiling Fundamentals of Laser Measurement & Beam Profiling Fundamentals of Laser Measurement & Beam Profiling

Is your laser's beam profile shaped correctly for your application?
This video teaches the fundamentals of laser beam profiles and discusses the benefits of profiling your laser beam.
Several case studies are presented showing before and after laser beam profiles.

See for yourself how easy it is to use a NanoScan to measure your laser beam. This 3-minute video shows the NanoScan profiling both a HeNe and a high power laser.

Support

Tutorials and Articles

Making High Power Measurements with Little to No Attenuation

High power is a fairly indistinct term that means different things in different contexts. High power laser beams are handled by using reflective materials, and the level of reflectivity is dependent on the wavelength of the laser light.  Read more...

Upgrading NS v2 software from Standard to Professional

The NS v2 software is the same for both Standard and Professional, no need to download/install a different version. To perform the upgrade you must purchase the license for the NS v2 Professional. With the included license key you can click on the blue scanhead image in the left corner and select About from the dropdown, where you can then upgrade the scanhead from the Upgrade License box (see below)... Read more...

White Paper – ISO compliance of non-contact, real-time beam analysis

1. IntroductionDuring the past decade laser power levels used in production applications has risen significantly. Today, welding systems are commonly using laser power in the range of multiple kilowatts. To deliver continuously high product quality, the key parameters of the laser beam must be measured on a regular basis. Ophir has tackled the task and developed a non-contact measurement technology based on the Rayleigh scattering. The technology used in the BeamWatch laser beam profilers enables the measurement of high-power beams without ever touching the laser beam. As the technology is Read more...

Laser forensics: The invisible, revealed and measured

IR laser technology from Scanovis revolutionizes forensics; Ophir measurement technology simplifies adjustment of the optics. Read more...

Measuring Laser Position & Pointing Stability

By Allen Cary, Director of Marketing, Ophir-Spiricon Read more...

Imaging UV light with CCD Cameras

Is it possible to image a UV laser with a Silicon Sensor CCD camera offered by Ophir-Spiricon? The answer is yes, but the direct UV light ablates Silicon CCD chips over time. The ablation is cumulative and depends on the intensity, the wavelength, and the duration of the light on the sensor. The best choice for imaging UV light without damage is to avoid directly imaging the beam on the CCD sensor by using an UV image converter... Read more...

Understanding Dynamic Range…The Numbers Game

There is a fair amount of confusion caused by the reporting of dynamic range of beam profilers. The purpose of this applications note is to explain some of the terminology used in the discussion of this parameter by both Ophir- Spiricon and other suppliers of beam profilers. DefinitionDynamic Range is the ratio of the largest measurable signal to the smallest measurable signal. The smallest measurable signal is typically defined as that equal to the noise level, or alternatively the “Noise Equivalent Exposure” or that point where the Signal-to-noise ratio (SNR) is 1. To Read more...

Laser Beam Measurement Vocabulary

Wavelength: In physics, the wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats,[1] and the inverse of the spatial frequency. It is usually determined by considering the distance between consecutive corresponding points of the same phase, such as crests, troughs, or zero crossings and is a characteristic of both traveling waves and standing waves, as well as other spatial wave patterns.[2][3] Wavelength is commonly designated by the Greek letter lambda (λ)... Read more...

Measurement of Mode Field Diameters of Tapered Fibers and Waveguides for Low Loss Components

Many forces drive the miniaturization of optical component technology. Integration of optical components into smaller packages is expected to reduce size constraints, insertion loss, and manufacturing costs. Many ambitious business plans are based on this integrated technology, as it seems amiable to high volume manufacturing methods similar to those found in the semiconductor industry. However, there are numerous technical hurdles to overcome before this Holy Grail is attained... Read more...

The Challenge of Focus Shift in High Power Laser Material Processing

High-power industrial lasers are valuable tools in material processing. Maintaining them at peak performance and optimizing the processes for which they are used will maximize throughput and minimize downtime. Periodic measurement and longterm monitoring of key laser variables, including laser output power, focused spot size, and focus spot temporal location provide the data you need to increase accuracy and optimize your process... Read more...