Silicon Scanning Slit Beam Profiler with 1.8 µm Slit

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Overview

The NanoScan™ 2s Si/3.5/1.8 scanning-slit profiling system accurately captures and analyzes wavelengths from 190 to 1100 nm with its Silicon detector. It features a 1.8 µm slit size suitable for small beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of UV, Visible, and NIR lasers.

3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
Power levels from 10 nW to 10W
Silicon detector covers 190 to 1100 nm spectral range
USB 2.0 interface
NanoScan Standard or Professional software included

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Products

		Compare	Model	Compatibility	sortOrder	rankScore	ranking	Drawings, CAD & Specs		Sensor Type	Spectral Range	Aperture Size	Beam Size	Power Range	Availability	Featured Item	Price		Brand
		PH00456 NS2s-SI/3.5/1.8-STD Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard In Stock	PH00456 NS2s-SI/3.5/1.8-STD Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard	UNIVERSAL	0.0	1.0	0.0		0.0	Silicon	190-1100 nm	3.5 mm	7 µm - 2.3 mm	10 nW - 10 W	In Stock				Ophir
		PH00464 NS2s-Si/3.5/1.8-PRO Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro In Stock	PH00464 NS2s-Si/3.5/1.8-PRO Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro	UNIVERSAL	0.0	1.0	0.0		0.0	Silicon	190-1100 nm	3.5 mm	7 µm - 2.3 mm	10 nW - 10 W	In Stock				Ophir

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Software

NanoScan Standard

NanoScan Standard is our full-function software with a extensive set of NIST traceable ISO beam width and roundness, beam position, and M2 measurements and a customizable under interface with the ease-of-use and flexibility that customers have come to expect.

NanoScan Professional

NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.

Software

NanoScan Standard

NanoScan Professional

Specifications

Product Name

NanoScan 2s Si/3.5/1.8
Sensor Type

Silicon Photodetector
Spectral Range

190 to 1100 nm
Slit Size

1.8 µm
Aperture Size

3.5 mm
Beam Size

7 μm to 2.3 mm

Scanhead Size

83 mm
Power Range

10 nW to 10 W
Communication

USB 2.0
CE Compliance

Yes
UKCA Compliance

Yes
China RoHS Compliance

Yes

Specifications

Product Name

NanoScan 2s Si/3.5/1.8
Sensor Type

Silicon Photodetector
Spectral Range

190 to 1100 nm
Slit Size

1.8 µm
Aperture Size

3.5 mm
Beam Size

7 μm to 2.3 mm

Scanhead Size

83 mm
Power Range

10 nW to 10 W
Communication

USB 2.0
CE Compliance

Yes
UKCA Compliance

Yes
China RoHS Compliance

Yes

Features

NanoScan 2s Slit Profiler Demonstration

Fundamentals of Laser Measurement & Beam Profiling

Is your laser's beam profile shaped correctly for your application? This video teaches the fundamentals of laser beam profiles and discusses the benefits of profiling your laser beam. Several case studies are presented showing before and after laser beam profiles.

Why Measure Your Laser Beam?

This tutorial is presented by Ophir-Spiricon sales engineers - the experts in the field of measuring lasers and in helping you get the most out of your laser beam.