NanoScan™ Scanning Slit Laser Beam Profilers
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels.
NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler
- 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
- Power levels from 10 nW to 10W
- Silicon detector covers 190 to 1100 nm spectral range
NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler
- 9 mm aperture for beam sizes from 20 µm to 6 mm
- Power Levels of 10 nW to 10 W
- Silicon detector covers 190 to 1100 nm spectral range
NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler
- 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
- Power levels from 10 nW to 10W
- Germanium detector covers 700 to 1800 nm spectral range
NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler
- 9 mm aperture for beam sizes from 20 µm to 6 mm
- Power levels from 10 nW to 10W
- Germanium detector covers 700 to 1800 nm spectral range
NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler
- 9 mm aperture for beam sizes from 20 µm to 6 mm
- Power Levels of 5 mW to 100 W
- Pyroelectric detector covers 190nm to 100 µm spectral range
Page 1 of 1
