BeamPeek™ High Power Laser Beam Analysis and Power Measurement System

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概览

Built to meet the precision demands of modern AM chambers, enabling exact laser measurement across key parameters

The BeamPeek™ system allows real-time beam profiling analysis, including focal spot size and position monitoring, and beam caustic and power measurement of Additive Manufacturing (AM) lasers in Green and NIR range. It tracks how those parameters change with time to assist in the maintenance of quality and repeatability of the manufactured parts. The BeamPeek™ integrates a laser beam profiler camera, power meter, beam dump, beam splitters, and optics to provide an all-inclusive solution for additive manufacturing laser analysis in an industrial environment.

BeamPeek™ software is specifically developed to focus on the needs of Field Technicians in the additive manufacturing industry. It can measure essential parameters for additive manufacturing with minimal user inputs.

The BeamPeek allows up to 2 minutes of continuous measurement at 1kW with passive cooling, no need for a fan or water/air chilling through the interchangeable beam dump cartridge. Its industrial design makes it easy to integrate into production lines and perform analysis of laser properties without interference with the production process.

Focal spot size
Focal spot position calibrated to build plane
Laser power
Laser power density
Changes in spot size & power over time

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制品

		对比	型号	兼容性	排序订单	排行得分	ranking	图纸、CAD和参数		光谱范围	功率范围	库存	指定物品	价格		牌
		SP90609 BeamPeek BeamPeek Beam Profiler, Focal Spot Analysis and Power Measurement ,AM Chambers 有现货	SP90609 BeamPeek BeamPeek Beam Profiler, Focal Spot Analysis and Power Measurement ,AM Chambers	UNIVERSAL	0.0	1.0	0.0		0.0	532 nm, 1030-1080 nm	10-1000 W	有现货				Ophir

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Software

BeamPeek™

BeamPeek™ software is designed to cater to the needs of additive manufacturing field technicians. It provides analysis of critical parameters for ISO Compliant Beam caustic and Power measurement for the Additive Manufacturing industry.

BeamPeek Tools

Software for BeamPeek Temperature Sensors reading, Focal plane and Optical axis position
To download the BeamPeek Start Setup for BeamGage Professional

产品规格

产品名称

BeamPeek
光谱范围

532 nm, 1030-1080 nm
最小光斑尺寸

34.5 µm
功率范围

10-1000 W
焦距

150-800 mm

功率计校准

NIST traceable calibration ±3%
光束轮廓

ISO 11146 Measurements
CE 符合性

Yes
UKCA 符合性

Yes
中国 RoHS 符合性

Yes

特征

BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing

常见问题

Where is the Camera sensor/Focal plane positioned?
回答
Unlike the BeamCheck that has the focal plane set so that the camera sensor is in focus when laser focus is positioned at bed surface, the BeamPeek camera sensor is approximate 70mm (the exact value is calibrated individually for each device) over the base/machine bed. To get the beam focus on camera sensor the machine bed must move down the by the calibrated value. The reason for this setup is improved power handling: higher maximum power and longer exposure time to high power.

IF power is higher value or longer exposure time than maximum allowed will the BeemPeek suffer heavy damage? How would I know if the device is damaged?
回答
The BeamPeek is designed with some spare regarding overload, power or exposure time; if the recommended values were overpassed there are simple visual inspection besides the functional test that customer can perform: removal of Beam Dump tray, checking cleanliness of the protective window (can be removed and cleaned of outgassing due to very high power density or too long exposure), remove and inspect the diffusing interchangeable lens and looking thru the system aperture with lens removed to verify optics integrity in case of too high power.

What is the minimum waiting time to get power measurements results?
回答
Minimum response time for power measurements is 3 seconds, as for power meters with thermal head.

Is a periodical calibration required for the BP?
回答
Yes, since the BeamPeek includes Ophir regular Power Meter.

If NIR laser wavelength 1070nm is used, which PM wavelength should be selected for measurements 1064nm or 1080nm?
回答
Select the wavelength which is closest to laser wavelength, in this case 1064 is closer than 1080.

常见问题

Where is the Camera sensor/Focal plane positioned?
回答
Unlike the BeamCheck that has the focal plane set so that the camera sensor is in focus when laser focus is positioned at bed surface, the BeamPeek camera sensor is approximate 70mm (the exact value is calibrated individually for each device) over the base/machine bed. To get the beam focus on camera sensor the machine bed must move down the by the calibrated value. The reason for this setup is improved power handling: higher maximum power and longer exposure time to high power.

IF power is higher value or longer exposure time than maximum allowed will the BeemPeek suffer heavy damage? How would I know if the device is damaged?
回答
The BeamPeek is designed with some spare regarding overload, power or exposure time; if the recommended values were overpassed there are simple visual inspection besides the functional test that customer can perform: removal of Beam Dump tray, checking cleanliness of the protective window (can be removed and cleaned of outgassing due to very high power density or too long exposure), remove and inspect the diffusing interchangeable lens and looking thru the system aperture with lens removed to verify optics integrity in case of too high power.

What is the minimum waiting time to get power measurements results?
回答
Minimum response time for power measurements is 3 seconds, as for power meters with thermal head.

Is a periodical calibration required for the BP?
回答
Yes, since the BeamPeek includes Ophir regular Power Meter.

If NIR laser wavelength 1070nm is used, which PM wavelength should be selected for measurements 1064nm or 1080nm?
回答
Select the wavelength which is closest to laser wavelength, in this case 1064 is closer than 1080.

配件

	对比	描述	兼容性	图纸、CAD和参数	库存	价格
		SP98005 Beam dump cartridge, Descript: Replicable beam dump cartridge for BeamPeek	UNIVERSAL		有现货	$2,446

资源

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BeamPeek™ High Power Laser Beam Analysis and Power Measurement System

BeamPeek™ High Power Laser Beam Analysis and Power Measurement System

概览

Built to meet the precision demands of modern AM chambers, enabling exact laser measurement across key parameters

制品

Software

BeamPeek™

BeamPeek Tools

产品规格

特征

BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing

常见问题

常见问题

配件

资源

Data Sheets

Manuals

Catalogs

Literature

Technical Articles

BeamWatch® AM

Ariel

BeamWatch® AM

Ariel

Have questions? Require assistance?

产品对比

BeamPeek™ High Power Laser Beam Analysis and Power Measurement System

BeamPeek™ High Power Laser Beam Analysis and Power Measurement System

概览

Built to meet the precision demands of modern AM chambers, enabling exact laser measurement across key parameters

制品

Software

产品规格

特征

BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing

常见问题

配件

资源

Data Sheets

Manuals

Catalogs

Literature

Technical Articles

相关产品

Have questions? Require assistance?