A Practical SWIR Beam Profiler for Large-Area Laser Diagnostics
Measuring shortwave infrared (SWIR) laser beams in real-world environments has long involved trade-offs between field of view, cost, and ease of deployment. While large-format SWIR cameras are not new, many solutions remain complex, expensive, or difficult to deploy outside controlled lab settings.
The Ophir SP403P SWIR Beam Profiler was developed as a more practical alternative, combining an appropriately sized imaging area with accessible pricing and straightforward operation, making it well suited for industrial and field use.
Why This Matters
SWIR wavelengths, especially the eye safe 1550nm region, play an important role in applications such as remote sensing, LIDARs, optical communications, and aerospace and defense systems. In many of these environments, beam profiling is needed not only for detailed analysis, but also for alignment, verification, and ongoing monitoring, often under constraints that go beyond pure measurement performance.
The SP403P addresses these needs by focusing on usability and deployment rather than pushing toward high-precision, high-complexity solutions.
Designed for Practical SWIR Beam Visualization
The SP403P provides an imaging sensor size well suited for common SWIR (1440-1605nm) beam visualization and alignment tasks, without the cost or complexity associated with higher-end systems. Its design accommodates beam sizes from 600 µm up to 12.3 mm, supporting a wide range of applications across R&D, production, and field environments.
Rather than introducing a fundamentally new sensor category, the SP403P represents a practical next step for users seeking a reliable and accessible SWIR beam profiling solution, particularly as a replacement for earlier-generation systems.
As Reuven Silverman, General Manager of Ophir Photonics Products, explains:
“Engineers shouldn’t have to compromise between coverage, cost, and usability. The SP403P brings these elements together, without export-control barriers that limit global deployment.”
Software and Workflow Support
The SP403P is supported by Ophir BeamGage® software, providing standardized beam analysis workflows aligned with ISO 11146-3. BeamGage enables users to perform key beam characterization tasks while supporting efficient operation in both laboratory and production environments.
With BeamGage, users can:
- Perform standardized measurements such as spot size and beam position
- Track trends, log data, and implement pass/fail testing
- Use image processing and visualization tools to support alignment and monitoring tasks
A compact USB 3.0 interface allows easy integration into laboratory setups, automated production lines, and field deployments where simplicity and robustness are essential.
Availability
The Ophir SP403P SWIR Beam Profiler is available now, offering engineers and system integrators a practical and accessible solution for large-area SWIR beam visualization, without unnecessary complexity, cost, or deployment barriers.
