SPIE Photonics West 2026 brought together the global photonics community once again, and we were thrilled to meet so many engineers, researchers, and system designers at our booth.
Over three busy days, we had great conversations about current challenges in laser measurement and beam analysis, especially around the need for solutions that can support both lab and production environments.
Several key trends stood out during Photonics West 2026, reflecting how laser measurement requirements continue to evolve across applications.
The evolution of high-power laser systems was evident at Photonics West 2026, highlighting measurement solutions designed for 70kW and higher in demanding industrial environments.
Highlights from the Show
At the booth, several themes stood out:
- Beam shaping and advanced profiles
Many visitors pointed out how accurate characterization is critical to getting consistent results in applications such as high-power processing and material manufacturing. - Demand for broad wavelength support
With increasing use of SWIR and near-eye-safe wavelengths in sensing and telecommunications, engineers were especially interested in tools that deliver reliable measurement across wide spectral ranges without export or cost limitations. - Practical measurement tools for real workflows
Conversations often came back to this point: it’s not enough to measure beams, engineers want fast, accurate analysis they can trust in real-world systems.
What Ophir Introduced in 2026
At SPIE Photonics West 2026, Ophir introduced several new measurement solutions designed to address emerging beam analysis challenges:
Ring-Core BeamGage® Software
The industry’s first commercial software specifically designed to analyze ring-core shaped beams using industry-standard beam profiling methods. It enables accurate, real-time evaluation of alignment, power distribution, and key geometric parameters for advanced industrial applications.
SP301Q Colloidal Quantum Dot (CQD) Beam Profiler
A cost-effective beam profiling solution covering wavelengths from 400 nm to 1700 nm, providing high-quality characterization across visible, NIR, and SWIR sources without the cost or export limitations of traditional InGaAs cameras.
SP403P SWIR Beam Profiler
A large-area SWIR beam profiler designed to accurately analyze wide beams, offering a generous field of view and high resolution for telecom, sensing, defense, and industrial environments.
These products reflect what we heard on the show floor: engineers want measurement solutions that are both advanced and practical.
Let’s Keep the Conversation Going
If you didn’t have a chance to stop by the booth, or if you’d like to explore our full set of measurement and analysis products, download the Ophir Photonics Product Catalog 2026. It includes our latest offerings across power and energy sensors and meters, beam profilers, and analysis software, all designed to help you measure with confidence.
👉 Download the Ophir Photonics Product Catalog 2026
Thank you again to everyone who visited us at SPIE Photonics West. We look forward to continuing the conversation throughout the year!
