Ophir-Spiricon Announces NanoScan™ 2s Scanning Slit Laser Beam Profiler for Sub-Micron Measurement of Beam Position and Size

November 2, 2015 - North Logan, UT – Ophir Photonics, global leader in precision laser measurement equipment and a Newport Corporation company, today announced the latest version of the company’s high power, scanning slit beam profiler, NanoScan™ 2s. Now available in a more compact size, NanoScan 2s is a NIST-calibrated profiler that instantly measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. The profiler offers silicon, germanium, or pyroelectric detectors; this allows profiling lasers of any wavelength, from UV to far infrared, to100μm and beyond. New NanoScan 2s software, available in Standard and Professional versions, allows users to custom configure the display interface; results can be shown on a single, easy-to-read screen or across multiple screens.

 Press Release
NanoScan™ 2s Data Sheet