MKS Instruments Announces Ophir® Wide Beam Imager for Measuring Large and Divergent Beams of SWIR Wavelengths

Andover, MA – November 17, 2020 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® Wide Beam Imager SWIR (WB-I SWIR), a compact, calibrated optical system for measuring the size and power distribution of large and divergent beams of VCSELs and LEDs in the SWIR range (900 - 1700nm). Current methods of profiling wide and divergent SWIR wavelength beams provide inaccurate results due to the high angle dependence of the sensor, or require bulky and expensive laboratory equipment that is not suitable for field operation or production environments. The WB-I SWIR profiler, when combined with Ophir BeamGage software and an InGaAs camera, is capable of imaging any beam shape (round, line, square, or doughnut) that is too large for a camera sensor. It features a 45mm diameter aperture and can accurately measure beams with an angle of incidence up to 70 degrees (compare with 15 degrees for standard beam profilers). Beams are captured on a translucent diffusive screen and then re-imaged to produce a complete and accurate mapping of the light's intensity distribution. The WB-I SWIR profiler is designed for use with camera-based beam profiling systems in such areas as eye-safe applications using IR VCSELs or diodes, automotive LIDAR, facial and gesture recognition, and remote sensing.