MKS Announces New Ophir® NanoScan™ Scanning Slit Laser Beam Profilers for Sub-Micron Measurement of Tunable Lasers and Mid IR Lasers

Andover, MA – August 14, 2018 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced new additions to the Ophir® NanoScan™ 2s line of high power, scanning slit laser beam profilers. NanoScan products are NIST-calibrated profilers that instantly measure beam position and size with submicron precision for CW and kilohertz pulsed lasers. NanoScan profilers offer a choice of silicon, germanium, or pyroelectric detectors, which allows profiling lasers of any wavelength, from UV to far infrared, to 100μm and beyond.