MKS Announces New Ophir® High Resolution Beam Profiling Camera with GigE Interface for High-Speed Applications

Andover, MA – July 31, 2018 – MKS Instruments, Inc. (NASDAQ: MKSI), a global provider of technologies that enable advanced processes and improve productivity, has announced the new Ophir® SP920G GigE Silicon CCD High Resolution Camera designed specifically for industrial laser beam profiling applications. The camera accurately captures and analyzes wavelengths from 190nm - 1100nm. It features a compact design, wide dynamic range, unparalleled signal to noise ratio, and high-speed GigE (Gigabit Ethernet) interface. The SP920G is ideal for measuring CW and pulsed laser profiles in such high-speed applications as laser cutting of medical devices or welding of dissimilar materials.