NanoScan 2s
NanoScan 2s
NanoScan 2s

NanoScan 2s Pyro/9/5-MIR


这款NanoScan狭缝扫描分析仪配备有热释电探测器,可精确捕获并分析900nm -5μm的波长。它有着适合大多数光束的狭缝和孔径尺寸,实时数据测量,可选功率测量功能,并采用连续波或kHz脉冲模式工作,是对任意波长激光器进行综合分析的理想之选。

  • 光束尺寸为20µm至6mm左右
  • 功率等级为5mW左右至100W左右
  • USB 2.0接口
  • 包括NanoScan标准或专业软件


  • 900nm -5μm
  • 20μm - ~6mm
  • USB 2.0
  • Pyroelectric
  • CW, Pulsed >25kHz
  • ~5mW - ~100W
  • 5µm
  • 9mm
  • 83mm
  • CE, China RoHS
Need help finding the right beam profiler? Try our Beam Profiler Wizard


The Pyroelectric NanoScans are available with the following versions of software. CLICK HERE for more information on the different versions of NanoScan software.

  • NS2s-Pyro/9/5-MIR-PRO


    NanoScan2s Pyro Detector 9mm Aperture 5.0µm slits. High-resolution head featuring pyroelectric detector, 63.5mm diameter head with rotation mount, 9mm entrance aperture, and matched pair of 5 µm wide slits. Use from 900nm -5μm wavelength.
    Software includes ActiveX automation feature.

  • Download NanoScan Professional
    NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.



Where is the detector in the NanoScan?

The detector is mounted internal to the NanoScan behind the rotating slits. This position is not important to the measurements. The measurement plane is the scan plane of the slits, which is nominally 0.74mm +/-0.025 mm from the Reference Surface on the front of the NanoScan. Please refer to the mechanical drawings in Appendix B of the NanoScan Operational Manual.

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Why is the silicon NanoScan not recommended for 1064nm beam measurements?

The silicon detector is very transparent to NIR light >1000nm. If it is used for measuring these beams, you will often see a tailing profile, because the signal does not decay fast enough. This will lead to erroneous results. We recommend using the germanium, or if there is enough power, the pyro electric detector for these wavelengths.

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After setting up the NanoScan profiler and acquiring the beam, the profile is bouncing back and forth.

This is usually caused by the Automatic ROI selection. After acquiring the beam, you should then uncheck the Auto ROI in the ROIs menu and the beam should stabilize.

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Won't the NanoScan slit diffract the beam?

Yes, but since the NanoScan measures all the light on the detector as a function of slit position, this does not affect the measurement results.

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My NanoScan system is giving me an error that says” The selected speed could not be set within 0.01%!” What does this mean?

This means that the motor is not able to set the rotation speed to within 0.01% precision. This typically means that the motor is wearing out, or that something is causing the motor to not be able to rotate at a constant speed. This typically requires that the system come back to the factory for inspection and repair.

This could also mean that you are running the wrong software. If the NanoScan does not have a Mini USB connection on the head, it should not be run on NanoScan 2.4.X software. It should be run on version 2.1 SR1 software.

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Can multiple NanoScans be run from the same PC, or can you connect multiple NanoScans and select the one you want to run?

Actually, only one NanoScan can be run from the NanoScan software at a time. If you did connect multiple NanoScans, only one will be recognized and able to run, and the other(s) will not be selectable.

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Using the NanoScan Slit Profiler Using the NanoScan Slit Profiler
Why Measure Your Laser Beam? Why Measure Your Laser Beam? Why Measure Your Laser Beam?

This tutorial is presented by Ophir-Spiricon sales engineers - the experts in the field of measuring lasers and in helping you get the most out of your laser beam.

Fundamentals of Laser Measurement & Beam Profiling Fundamentals of Laser Measurement & Beam Profiling Fundamentals of Laser Measurement & Beam Profiling

Is your laser's beam profile shaped correctly for your application?
This video teaches the fundamentals of laser beam profiles and discusses the benefits of profiling your laser beam.
Several case studies are presented showing before and after laser beam profiles.

See for yourself how easy it is to use a NanoScan to measure your laser beam. This 3-minute video shows the NanoScan profiling both a HeNe and a high power laser.


Tutorials and Articles

Making High Power Measurements with Little to No Attenuation

High power is a fairly indistinct term that means different things in different contexts. High power laser beams are handled by using reflective materials, and the level of reflectivity is dependent on the wavelength of the laser light.  阅读更多...

Upgrading NS v2 software from Standard to Professional

The NS v2 software is the same for both Standard and Professional, no need to download/install a different version. To perform the upgrade you must purchase the license for the NS v2 Professional. With the included license key you can click on the blue scanhead image in the left corner and select About from the dropdown, where you can then upgrade the scanhead from the Upgrade License box (see below)... 阅读更多...

White Paper – ISO compliance of non-contact, real-time beam analysis

1. IntroductionDuring the past decade laser power levels used in production applications has risen significantly. Today, welding systems are commonly using laser power in the range of multiple kilowatts. To deliver continuously high product quality, the key parameters of the laser beam must be measured on a regular basis. Ophir has tackled the task and developed a non-contact measurement technology based on the Rayleigh scattering. The technology used in the BeamWatch laser beam profilers enables the measurement of high-power beams without ever touching the laser beam. As the technology is 阅读更多...

Laser forensics: The invisible, revealed and measured

IR laser technology from Scanovis revolutionizes forensics; Ophir measurement technology simplifies adjustment of the optics. 阅读更多...

Measuring Laser Position & Pointing Stability

By Allen Cary, Director of Marketing, Ophir-Spiricon 阅读更多...

Imaging UV light with CCD Cameras

Is it possible to image a UV laser with a Silicon Sensor CCD camera offered by Ophir-Spiricon? The answer is yes, but the direct UV light ablates Silicon CCD chips over time. The ablation is cumulative and depends on the intensity, the wavelength, and the duration of the light on the sensor. The best choice for imaging UV light without damage is to avoid directly imaging the beam on the CCD sensor by using an UV image converter... 阅读更多...

Understanding Dynamic Range…The Numbers Game

There is a fair amount of confusion caused by the reporting of dynamic range of beam profilers. The purpose of this applications note is to explain some of the terminology used in the discussion of this parameter by both Ophir- Spiricon and other suppliers of beam profilers. DefinitionDynamic Range is the ratio of the largest measurable signal to the smallest measurable signal. The smallest measurable signal is typically defined as that equal to the noise level, or alternatively the “Noise Equivalent Exposure” or that point where the Signal-to-noise ratio (SNR) is 1. To 阅读更多...

Laser Beam Measurement Vocabulary

Wavelength: In physics, the wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats,[1] and the inverse of the spatial frequency. It is usually determined by considering the distance between consecutive corresponding points of the same phase, such as crests, troughs, or zero crossings and is a characteristic of both traveling waves and standing waves, as well as other spatial wave patterns.[2][3] Wavelength is commonly designated by the Greek letter lambda (λ)... 阅读更多...

Measurement of Mode Field Diameters of Tapered Fibers and Waveguides for Low Loss Components

Many forces drive the miniaturization of optical component technology. Integration of optical components into smaller packages is expected to reduce size constraints, insertion loss, and manufacturing costs. Many ambitious business plans are based on this integrated technology, as it seems amiable to high volume manufacturing methods similar to those found in the semiconductor industry. However, there are numerous technical hurdles to overcome before this Holy Grail is attained... 阅读更多...