BeamPeek™
BeamPeek™系统实现了增材制造（AM）激光器的同步光束分析、焦点大小和位置以及功率测量。它跟踪这些参数如何随时间变化，以帮助保持制造零件的质量和可重复性。BeamPeek™集成了激光光束分析相机、功率计、光束收集器、分束器和光学器件，为工业环境中的增材制造激光分析提供了全包解决方案。
- 焦点大小
- 校准焦点位置以构建平面
- 激光功率
- 激光功率密度
- 焦点大小和功率随时间的变化
BeamPeek允许在1kW功率条件下通过被动冷却进行长达2分钟的连续测量，而无需风扇或水/空气冷却。其工业设计使其易于集成到生产过程中并在不干扰生产过程的情况下执行激光特性分析。
Specification
- 532nm, 1030-1080nm
- 34.5µm - 2mm
- 10 - 1000 Watts
- 150mm-800mm
- ±100µm
- ISO 11146 Measurements
- NIST traceable calibration ±3%
- CE, UKCA, China RoHS
Ordering
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BeamPeek
SP90609Beam Profiling, focal spot analysis and power measurement system for AM chambers
询问报价
Documentions
BeamGage ProfessionalBeamGage Professional has all of the functionality that BeamGage Standard includes. BeamGage Professional supports all of our beam profiling cameras, includes window partitioning to allow analysis of multiple beams on a single camera, and includes an automation interface written in .NET to push data to your custom applications.
StarLabThe StarLab application together with an Ophir meter turns your PC or laptop into a full-fledged laser power/energy meter. Supports most Ophir laser power/energy sensors. Up to 8 sensors can be displayed at once on one PC. By using the Ophir COM Object, you can control the device from your own application. Supports the Ariel, Centauri, StarBright, StarLite, Juno, Juno+, Juno-RS, Nova II, Vega, Pulsar-1/2/4, Quasar, EA-1 and IPM sensor devices.
BeamPeek Tools Software for BeamPeek Temperature Sensors reading, Focal plane and Optical axis position
To install the BeamPeek Tools
To download the BeamPeek Start Setup for BeamGage Professional
Drawings
FAQ
Is a periodical calibration required for the BP?
Where is the Camera sensor/Focal plane positioned?
Unlike the BeamCheck that has the focal plane set so that the camera sensor is in focus when laser focus is positioned at bed surface, the BeamPeek camera sensor is approximate 75mm (the exact value is calibrated individually for each device) over the base/machine bed. To get the beam focus on camera sensor the machine bed must move down the by the calibrated value. The reason for this setup is improved power handling: higher maximum power and longer exposure time to high power.
CloseWhat is the minimum waiting time to get power measurements results?
IF power is higher value or longer exposure time than maximum allowed will the BeemPeek suffer heavy damage? How would I know if the device is damaged?
The BeamPeek is designed with some spare regarding overload, power or exposure time; if the recommended values were overpassed there are simple visual inspection besides the functional test that customer can perform: removal of Beam Dump tray, checking cleanliness of the protective window (can be removed and cleaned of outgassing due to very high power density or too long exposure), remove and inspect the diffusing interchangeable lens and looking thru the system aperture with lens removed to verify optics integrity in case of too high power.
CloseVideos
An integrated beam analysis and power measurement system for fast, accurate, real-time measurement of lasers in additive manufacturing chambers.
The BeamPeek system provides simultaneous beam profiling, focal spot analysis, and power measurement in just three (3) seconds. There is no need for water or fan cooling as the system includes a replaceable passive cooling beam dump tray that eliminates downtime between measurement sessions (Patent-Pending cooling solution).
The BeamPeek system is ideal for field service testing of additive manufacturing chamber powder beds. It is able to withstand chamber conditions, including the presence of metal powder residuals and when cooling agents or airflow connection points are not available.