宽光束成像仪

Ophir宽光束成像仪: WB-I,一款用于光束分析相机的紧凑型校准附件,提供了一种测量来自VCSEL、LED以及平行光束等光源的发散和大直径光束的尺寸和功率分布的方法。它采用45mm漫射板,来自光源的光束投射到该漫射板上。然后将该图像缩小8倍并重新成像到相机的焦平面上。VCSEL、LED和光纤激光器用于许多灵敏应用。为了保证设备的高质量,必须对光束轮廓进行分析,但是那些宽的、发散的光束对测量系统提出了特定的要求:

  • 传统光束分析仪的孔径太小,无法收集大型或发散光源的完整光斑。
  • 发散光束不能通过常规探测器准确测量,因为探测器的量子效率高度依赖于入射角。WB-I的紧凑、坚固和便携式设计可在客户现场为VCSEL和LED系统的光束分析提供现场服务,并可在生产线和研发实验室进行操作。
  • 与标准光束分析仪传感器的15°相比,由于可以进行高达70°的角度测量,发散光束测量得到显著改善。
  • 结合相机和BeamGage软件,WB-I附件提供了实时光束形状分析和光束形状变化的可视化,因为其能够轻松检测不同的电流。
  • 通过一组可互换的滤光片或光圈实现了可变衰减,进而能够测量各种不同发射功率的光源。

指定用于以下领域的研发、生产和服务: 数据通信、汽车、遥感、人脸和手势识别
典型光源: VCSEL、LED、宽激光束、光纤
典型测量: 远场能量分布、发散、LIV扫描测试VCSEL(光束轮廓与电流(A))
WB-I附件有2个版本: UV-VIS-NIR(350-1100nm)或SWIR(900-1700nm),专为对人眼安全的红外应用而设计。购买的WB-I不带相机。欲获得包含BeamGage Professional成像和分析软件的完整解决方案,可以添加高分辨率相机。

Cameras

Application example
VCSEL energy distribution directly depends on parameters such as current, pulse width and repetition rate and temperature of the device. Therefore, it is essential to measure the angle distribution of VCSELs at various stages of the manufacturing process as well as in R&D and field service. VCSEL behavior on the LIV sweep test: VCSELs are in a so called “LED mode” when there is only a low current applied. Once the current applied to the VCSEL rises, its beam profile changes to “Laser mode”:

ModelWide Beam Imager VISBeam Imager SWIR
Wavelengths350(1)-1100nm900-1700nm
Active area(2)Ø45mmØ45mm
Beam sizes (2), (3)10mm– 45mm10mm– 45mm
Angle of incidence<70°>70°
Minimum detail(4), (5)0.5mm0.5mm
Lowest measurable signal100μW/cm²(6)3μW/cm² (With Iris fully opened at 1550nm)
Maximum power exposure CW(7)200W unlimited, 1000W for 1 minute50W unlimited time
Maximum energy exposure(8)For ns pulses 1.5J/cm²N/A
Imager recess supported4.5mm17.5 mm (C-Mount)
DimensionsL=265mm X Ø57mm (Ø73mm Iris control)L=265mm X Ø57mm (Ø73mm Iris control)
Weight (with support)0.5 kg (0.7 kg)0.6 kg (0.8 kg)
Part numberSP90612SP90605
Notes:(1) Camera response down to 350nm. Below this, flourescence of screen will be imaged
(2) Limited to 43 mm in Y direction by camera sensor
(3) 5mm possible with reduced accuracy
(4) For low contrast artefacts, due to blur effect (~0.8mm)
(5) Small diameter evaluation error is < 5%, decreases proportionally with increased diameter
(6) With two ND1 filters mounted on camera
(7) For WB-I VIS: 20% is backward scattered, WB-I SWIR: 50% is backward scattered
(8) At 1.064μm. For wavelengths below 0.9μm, derate to 40% of above , for <0.4μm to 20%