BeamPeek™

 
Description: 

The BeamPeek™ system allows simultaneous beam profiling, focal spot size and position, and power measurement of Additive Manufacturing (AM) lasers. It tracks how those parameters change with time to assist in the maintenance of quality and repeatability of the manufactured parts. The BeamPeek™ integrates a laser beam profiler camera, power meter, beam dump, beam splitters, and optics to provide an all inclusive solution for additive manufacturing laser analysis in an industrial environment.

  • Focal spot size
  • Focal spot position calibrated to build plane
  • Laser power
  • Laser power density
  • Changes in spot size & power over time

The BeamPeek allows up to 2 minutes of continuous measurement at 1kW with passive cooling, without any need for a fan or water/air chilling through a beam dump interchangeable cartridge. Its industrial design makes it easy to integrate into production lines and perform analysis of laser properties without interference with the production process.

Specification

  • 532nm, 1030-1080nm
  • 34.5µm - 2mm
  • 10 - 1000 Watts
  • 150mm-800mm
  • ±100µm
  • ISO 11146 Measurements
  • NIST traceable calibration ±3%
  • CE, UKCA, China RoHS
Need help finding the right beam profiler? Try our Beam Profiler Finder

Ordering

  • BeamPeek

    SP90609

    Short Description: Beam Profiling, focal spot analysis and power measurement system for AM chambers

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  • BeamGage ProfessionalBeamGage Professional
    BeamGage Professional has all of the functionality that BeamGage Standard includes. BeamGage Professional supports all of our beam profiling cameras, includes window partitioning to allow analysis of multiple beams on a single camera, and includes an automation interface written in .NET to push data to your custom applications.
  • StarLab

    The StarLab application together with an Ophir meter turns your PC or laptop into a full-fledged laser power/energy meter. Supports most Ophir laser power/energy sensors. Up to 8 sensors can be displayed at once on one PC. By using the Ophir COM Object, you can control the device from your own application. Supports the Ariel, Centauri, StarBright, StarLite, Juno, Juno+, Nova II, Vega, Pulsar-1/2/4, Quasar, EA-1 and IPM sensor devices.

  • BeamPeek Tools

    Software for BeamPeek Temperature Sensors reading, Focal plane and Optical axis position

    To install the BeamPeek Tools

Drawings

FAQ

Is a periodical calibration required for the BP?

Yes, since the BeamPeek includes Ophir regular Power Meter.

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Where is the Camera sensor/Focal plane positioned?

Unlike the BeamCheck that has the focal plane set so that the camera sensor is in focus when laser focus is positioned at bed surface, the BeamPeek camera sensor is approximate 75mm (the exact value is calibrated individually for each device) over the base/machine bed. To get the beam focus on camera sensor the machine bed must move down the by the calibrated value. The reason for this setup is improved power handling: higher maximum power and longer exposure time to high power.

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What is the minimum waiting time to get power measurements results?

Minimum response time for power measurements is 3 seconds, as for power meters with thermal head.

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IF power is higher value or longer exposure time than maximum allowed will the BeemPeek suffer heavy damage? How would I know if the device is damaged?

The BeamPeek is designed with some spare regarding overload, power or exposure time; if the recommended values were overpassed there are simple visual inspection besides the functional test that customer can perform: removal of Beam Dump tray, checking cleanliness of the protective window (can be removed and cleaned of outgassing due to very high power density or too long exposure), remove and inspect the diffusing interchangeable lens and looking thru the system aperture with lens removed to verify optics integrity in case of too high power.

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If NIR laser wavelength 1070nm is used, which PM wavelength should be selected for measurements 1064nm or 1080nm?

Select the wavelength which is closest to laser wavelength, in this case 1064 is closer than 1080.

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Videos

BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing BeamPeek™, High Power Laser Beam Analysis and Power Measurement System for Additive Manufacturing

An integrated beam analysis and power measurement system for fast, accurate, real-time measurement of lasers in additive manufacturing chambers.
The BeamPeek system provides simultaneous beam profiling, focal spot analysis, and power measurement in just three (3) seconds. There is no need for water or fan cooling as the system includes a replaceable passive cooling beam dump tray that eliminates downtime between measurement sessions (Patent-Pending cooling solution).
The BeamPeek system is ideal for field service testing of additive manufacturing chamber powder beds. It is able to withstand chamber conditions, including the presence of metal powder residuals and when cooling agents or airflow connection points are not available.

Support

Tutorials and Articles

Evolution of Measurement Technology for Laser-Based Additive Manufacturing Systems

MKS Instruments recognized early on that measuring the laser beam in laser-based AM processes would become the key to efficient production. Four years ago, the company introduced the first measuring device that could assess – without any contact – the caustics of the laser beam on the building plane. This was followed by the launch of Ophir Ariel, an innovative power meter for AM applications. Then at Laser World of Photonics 2022 in Munich, the manufacturer introduced Ophir BeamPeek ™, an integrated measuring system that bundles the various measuring tasks into one robust Read more...