Stackable Prism Front-Surface Beam Samplers

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Overview

The Prism Front-Surface Beam Sampler (PFSA) is a C-mount fixture housing a UV-Grade Fused Silica right angle prism, used for sampling the front surface reflection for high power/energy beam-profiling applications. Reflection at the nominal incidence of 45° is polarization and wavelength dependent.

C-mount fixture housing
UVFS right angle prism
Sample the front surface reflection

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Products

		Compare	Model	Compatibility	sortOrder	rankScore	ranking	Drawings, CAD & Specs		Availability	Featured Item	Price		Brand
		PH00052 PFSA Front-Surface Beam Sampler, Single Prism, C-mount $1,176.00 In Stock	PH00052 PFSA Front-Surface Beam Sampler, Single Prism, C-mount	UNIVERSAL	0.0	1.0	0.0		0.0	In Stock		$1,176.00		Ophir
		PH00053 DPFSA Front-Surface Beam Sampler, Dual Prism, C-mount $1,784.00 In Stock	PH00053 DPFSA Front-Surface Beam Sampler, Dual Prism, C-mount	UNIVERSAL	0.0	1.0	0.0		0.0	In Stock		$1,784.00		Ophir

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Specifications

Spectral Range

200-2500 nm
Angle of Incidence

45°
Reflection

P: 0.64-0.88%, S: 8.01-9.40%
Damage Threshold

100 MW/cm²
Surface Accuracy

λ/10

Surface Quality

20-10 Scratch-Dig
Material

UV-Grade Fused Silica
Clear Aperture

14x14 mm
Interface

C-mount

Features

Single and Dual Prism Front-Surface Beam Samplers

The Front-Surface Beam Sampler is available as either a single prism (PFSA) or dual orthogonal prism (DPFSA) unit. Reflection of the prism at the nominal incidence of 45° is polarization and wavelength dependent, with 532 nm s-polarization reflected at 8.27%, and p-polarization at 0.68% for PFSA. The DPFSA configuration results in polarization independent reflection of 0.057% at 532 nm.

Reflection at λ (nm)	P- Polarization	S- Polarization
248.3	0.88%	9.40%
351.1	0.75%	8.65%
532	0.68%	8.27%
1064	0.64%	8.01%

Other filters and attenuators can be attached using the C-mount female threads at the input end. The use of a right-angle prism to sample the incident beam guarantees that any scattered secondary beams do not interfere with the measurement.