{"id":35913,"date":"2026-02-18T11:00:00","date_gmt":"2026-02-18T11:00:00","guid":{"rendered":"https:\/\/www.ophiropt.com\/blog\/?p=35913"},"modified":"2026-02-18T17:43:00","modified_gmt":"2026-02-18T17:43:00","slug":"cqd-beam-profiler-visible-to-swir-ophir-sp301q","status":"publish","type":"post","link":"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/","title":{"rendered":"Introducing the Ophir\u00ae SP301Q CQD Beam Profiler"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\"><strong>Cost-Effective, High-Performance Beam Characterization from Visible to SWIR<\/strong><\/h2>\n\n\n\n<p>Accurate laser beam characterization is essential across a growing range of photonics applications, from LiDAR and face recognition to optical communications to military systems. Yet for many engineers and system integrators, accessing high-quality shortwave infrared (SWIR) beam profiling has traditionally required expensive, export-controlled camera technologies.<\/p>\n\n\n\n<p>To address this gap, MKS Inc. has introduced the <a href=\"https:\/\/www.ophiropt.com\/en\/f\/sp301q-gige-laser-beam-profiler\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Ophir\u00ae SP301Q Colloidal Quantum Dot (CQD) Beam Profiler<\/strong><\/a>, a next-generation solution designed to deliver high performance across visible, NIR, and SWIR wavelengths in a more accessible and cost-effective platform.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img decoding=\"async\" width=\"489\" height=\"394\" data-src=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/01\/Screenshot_20-1-2026_114010_www.ophiropt.com_.jpeg\" alt=\"\" class=\"wp-image-35819 lazyload\" style=\"--smush-placeholder-width: 489px; --smush-placeholder-aspect-ratio: 489\/394;width:395px;height:auto\" data-srcset=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/01\/Screenshot_20-1-2026_114010_www.ophiropt.com_.jpeg 489w, https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/01\/Screenshot_20-1-2026_114010_www.ophiropt.com_-191x154.jpeg 191w\" data-sizes=\"(max-width: 489px) 100vw, 489px\" src=\"data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMSIgaGVpZ2h0PSIxIiB4bWxucz0iaHR0cDovL3d3dy53My5vcmcvMjAwMC9zdmciPjwvc3ZnPg==\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Expanding Access to SWIR Beam Profiling<\/strong><\/h2>\n\n\n\n<p>Conventional SWIR beam characterization often relies on InGaAs camera sensors, technologies that can be costly and subject to dual-use export controls. The SP301Q profiler leverages Colloidal Quantum Dot (CQD) sensor technology to overcome these limitations. CQD sensors, built from nanoscale semiconductor crystals, provide an efficient alternative while delivering performance comparable to InGaAs-based systems.<\/p>\n\n\n\n<p>This approach enables:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Lower system cost<\/li>\n\n\n\n<li>Reduced regulatory complexity<\/li>\n\n\n\n<li>High sensitivity for SWIR applications<\/li>\n\n\n\n<li>Comparable accuracy and resolution to traditional solutions<\/li>\n<\/ul>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img decoding=\"async\" width=\"1200\" height=\"600\" data-src=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover.png\" alt=\"\" class=\"wp-image-35939 lazyload\" style=\"--smush-placeholder-width: 1200px; --smush-placeholder-aspect-ratio: 1200\/600;width:745px;height:auto\" data-srcset=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover.png 1200w, https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover-308x154.png 308w, https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover-768x384.png 768w\" data-sizes=\"(max-width: 1200px) 100vw, 1200px\" src=\"data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMSIgaGVpZ2h0PSIxIiB4bWxucz0iaHR0cDovL3d3dy53My5vcmcvMjAwMC9zdmciPjwvc3ZnPg==\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Broad Wavelength Coverage: 400\u20131700 nm<\/strong><\/h2>\n\n\n\n<p>The SP301Q supports beam characterization across a wide spectral range:<\/p>\n\n\n\n<p>Particularly optimized for <strong>1550 nm SWIR lasers<\/strong><\/p>\n\n\n\n<p><strong>400 nm to 1700 nm<\/strong> wavelength coverage<\/p>\n\n\n\n<p>Compatible with visible, NIR, and SWIR sources<\/p>\n\n\n\n<p>Lasers operating at 1550 nm are widely used due to their eye safety and favorable atmospheric transmission, making them optimal for LiDAR, optical communication, and remote sensing and military applications.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>High-Fidelity Beam Analysis<\/strong><\/h2>\n\n\n\n<p>Engineered for detailed beam diagnostics, the profiler combines sensitivity, speed, and dynamic performance:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>High sensitivity for low-signal detection<\/li>\n\n\n\n<li>Wide dynamic range<\/li>\n\n\n\n<li>Global shutter<\/li>\n<\/ul>\n\n\n\n<p>These capabilities enable precise analysis of:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Beam shape<\/li>\n\n\n\n<li>Spot size<\/li>\n\n\n\n<li>Spatial power distribution<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Sensor and Imaging Specifications<\/strong><\/h2>\n\n\n\n<p>The SP301Q is designed to balance measurement accuracy with practical usability:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Active area:<\/strong> 9.6 mm \u00d7 7.7 mm<\/li>\n\n\n\n<li><strong>Resolution:<\/strong> 640 \u00d7 512 pixels (VGA)<\/li>\n\n\n\n<li><strong>Pixel Size:<\/strong> 15\u00b5m x15 \u00b5m<\/li>\n<\/ul>\n\n\n\n<p>This format supports detailed spatial profiling while maintaining efficient data handling and integration into laboratory or production environments.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Powered by BeamGage\u00ae Professional Software<\/strong><\/h2>\n\n\n\n<p>The profiler is delivered with <strong>Ophir BeamGage\u00ae Professional<\/strong>, an advanced beam analysis platform widely used in research and industrial settings.<\/p>\n\n\n\n<p>Key capabilities include:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>ISO-compliant beam measurements<\/li>\n\n\n\n<li>Power density analysis<\/li>\n\n\n\n<li>Spot diameter and position calculations<\/li>\n\n\n\n<li>Comprehensive beam characterization tools<\/li>\n<\/ul>\n\n\n\n<p>BeamGage is built on <strong>Ultracal&#x2122;<\/strong>, a proprietary baseline correction algorithm that contributed to establishing the ISO 11146-3 standard for beam measurement accuracy.<\/p>\n\n\n\n<p>Additional software features include:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Advanced image processing<\/li>\n\n\n\n<li>Trend charting<\/li>\n\n\n\n<li>Data logging<\/li>\n\n\n\n<li>Pass\/fail production testing<\/li>\n\n\n\n<li>Multilingual interface support<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Designed for Integration and Production Environments: LiDAR, Communications, Defense<\/strong><\/h2>\n\n\n\n<p>Beyond lab use, the SP301Q supports industrial deployment through:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>GigE interface<\/strong> for high-speed data transfer<\/li>\n\n\n\n<li>Seamless integration into manufacturing and test networks<\/li>\n<\/ul>\n\n\n\n<p>This makes it suitable for inline monitoring, automated testing, and process validation workflows.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img decoding=\"async\" width=\"1200\" height=\"400\" data-src=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/Quotes-Templates.png\" alt=\"\" class=\"wp-image-35921 lazyload\" style=\"--smush-placeholder-width: 1200px; --smush-placeholder-aspect-ratio: 1200\/400;width:855px;height:auto\" data-srcset=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/Quotes-Templates.png 1200w, https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/Quotes-Templates-322x107.png 322w, https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/Quotes-Templates-768x256.png 768w\" data-sizes=\"(max-width: 1200px) 100vw, 1200px\" src=\"data:image\/svg+xml;base64,PHN2ZyB3aWR0aD0iMSIgaGVpZ2h0PSIxIiB4bWxucz0iaHR0cDovL3d3dy53My5vcmcvMjAwMC9zdmciPjwvc3ZnPg==\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Integration into Production Environments<\/strong><\/h2>\n\n\n\n<p>The profiler is engineered for a wide range of photonics and electro-optical use cases, including:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>LiDAR for autonomous vehicles<\/li>\n\n\n\n<li>Remote sensing<\/li>\n\n\n\n<li>Optical communications<\/li>\n\n\n\n<li>Defense and military laser systems<\/li>\n<\/ul>\n\n\n\n<p><strong>Availability<\/strong> The <strong><a href=\"https:\/\/www.ophiropt.com\/en\/f\/sp301q-gige-laser-beam-profiler\" type=\"link\" id=\"https:\/\/www.ophiropt.com\/en\/f\/sp301q-gige-laser-beam-profiler\" target=\"_blank\" rel=\"noreferrer noopener\">Ophir SP301Q CQD Beam Profiler<\/a><\/strong> is available now.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Cost-Effective, High-Performance Beam Characterization from Visible to SWIR Accurate laser beam characterization is essential across a growing range of photonics [&hellip;]<\/p>\n","protected":false},"author":16,"featured_media":35936,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center 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center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[3],"tags":[16,21],"ophirposttype":[349],"class_list":["post-35913","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-laser-beam-analysis","tag-beam-profiling","tag-cameras","ophirposttype-blogpost-en"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.2 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>CQD Beam Profiler for Visible to SWIR | Ophir SP301Q<\/title>\n<meta name=\"description\" content=\"Discover the Ophir SP301Q CQD beam profiler for accurate laser beam analysis from 400\u20131700 nm. Cost-effective SWIR profiling with BeamGage software.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"CQD Beam Profiler for Visible to SWIR | Ophir SP301Q\" \/>\n<meta property=\"og:description\" content=\"Discover the Ophir SP301Q CQD beam profiler for accurate laser beam analysis from 400\u20131700 nm. Cost-effective SWIR profiling with BeamGage software.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\" \/>\n<meta property=\"og:site_name\" content=\"Ophir Photonics\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/OphirPhotonicsGroup\/\" \/>\n<meta property=\"article:published_time\" content=\"2026-02-18T11:00:00+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-02-18T17:43:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover-1.png\" \/>\n\t<meta property=\"og:image:width\" content=\"1200\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"author\" content=\"Yoni Groisman\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Yoni Groisman\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\"},\"author\":{\"name\":\"Yoni Groisman\",\"@id\":\"https:\/\/www.ophiropt.com\/blog\/#\/schema\/person\/2036202cd8e5c375f8901f4dcaa6c2ad\"},\"headline\":\"Introducing the Ophir\u00ae SP301Q CQD Beam Profiler\",\"datePublished\":\"2026-02-18T11:00:00+00:00\",\"dateModified\":\"2026-02-18T17:43:00+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\"},\"wordCount\":500,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/#organization\"},\"image\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover-1.png\",\"keywords\":[\"Beam Profiling\",\"Cameras\"],\"articleSection\":[\"Laser Beam Analysis\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\",\"url\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/\",\"name\":\"CQD Beam Profiler for Visible to SWIR | Ophir SP301Q\",\"isPartOf\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/www.ophiropt.com\/blog\/cqd-beam-profiler-visible-to-swir-ophir-sp301q\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/www.ophiropt.com\/blog\/wp-content\/uploads\/2026\/02\/New-blog-Cover-1.png\",\"datePublished\":\"2026-02-18T11:00:00+00:00\",\"dateModified\":\"2026-02-18T17:43:00+00:00\",\"description\":\"Discover the Ophir SP301Q CQD beam profiler for accurate laser beam analysis from 400\u20131700 nm. 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