August 2012
Photonics Online

Photon, global leader in precision laser measurement equipment and a Newport Corporation brand, recently announced NanoScan v2, the newest version of the company's scanning slit beam profiler. NanoScan is a NIST-calibrated laser beam profiler. The system uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, with little to no attenuation. The new version adds an enhanced graphical user interface (GUI) with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows plus concealable ribbon toolbars allow users to make the most of any size display, from small laptops to large, multi-monitor desktops.

Read More»
Optoelectronics Online

Photon today announced NanoScan v2, the newest version of the company's scanning slit beam profiler. NanoScan is a NIST-calibrated laser beam profiler. The system uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, with little to no attenuation. The new version adds an enhanced graphical user interface (GUI) with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows plus concealable ribbon toolbars allow users to make the most of any size display, from small laptops to large, multi-monitor desktops.

Read More»
Photonics.com

NORTH LOGAN, Utah, Aug. 16, 2012 — Photon, a Newport Corp. brand, has introduced the NanoScan v2, the latest version of its scanning-slit beam profiler. The NIST-calibrated laser beam profiler uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, with little to no attenuation. The new version adds an enhanced graphical user interface with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows plus concealable ribbon toolbars allow users to make the most of any size display, from small laptops to large multimonitor desktops.

Read More»
Desktop Engineering Online

Photon, part of Ophir Photonics, announced NanoScan v2, the newest version of the company's scanning slit beam profiler. NanoScan is a NIST-calibrated laser beam profiler, which uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts. The new version adds an enhanced graphical user interface (GUI) with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows, plus concealable ribbon toolbars, improve display utilization.

Read More»
Photonics Online

One of the facilities of a solar panel manufacturer processes approximately 1,000 panels per shift. Each panel is about 1.5ft x 4ft in size and generates 60W. Their production cost of $2.00 per panel is one of the lowest in the industry.

Read More»
R&D Magazine Online

2012 R&D 100 Winner

Not all lasers are created equal. Even those with the same wavelength and power level can have strikingly different beam profiles. To aid productivity and quality in industrial applications, thermal detectors are used to measure the power and energy of lasers. But to complete the picture of the laser's performance, an additional beam profiler is needed to measure the beam's profile.

Read More»
Industrial Lasers Online

Photon/Ophir Photonics (a Newport brand), North Logan, UT has released newest version of its NanoScan scanning slit beam profiler, used for profiling CO2 beams in material processing applications. The key enhancement to NanoScan v2 is an enhanced graphical user interface (GUI) that supports Microsoft Windows' ribbon toolbar; adding concealable ribbon toolbars to dockable and floatable windows helps the software fit user displays from small laptops to multimonitor desktops.

Read More»
Industrial Lasers Online

Laser processing is widely used in diverse manufacturing processes including aerospace and automotive components, consumer and healthcare products, and even frames for windows. Different laser-specific processes are utilized: cladding, cutting, drilling, marking, and welding. For each process, beam power and intensity are critical parameters to ensure the quality of the process; consequently, laser beam power is the primary parameter that is monitored or controlled. Other beam parameters such as beam mode or quality may also be monitored as they affect the spot size at the point of application. The beam intensity is the ratio of the power to the area of the beam spot. Industrial laser systems provide a continuous readout of the beam power for continuous wave (cw) outputs. The laser system usually samples a small fraction of the total beam power for monitoring whereas many users prefer to sample the beam near the point of use.

Read More»
Measurements Devices.com

North Logan UT, USA - The editors of R&D Magazine have announced the winners of the 50th Annual R&D 100 Awards. These awards recognize the 100 most technologically significant products introduced into the market over the past year.

Read More»