| Slit - Based Beam Propagation Analyzer M² | ![]() |
| Measures ISO 11146 Propagation Parameters
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Description
Specifications
Ordering Info
Catalog/Manual
| For lasers with wavelengths in the UV and IR ranges which are either difficult or impossible to measure with a CCD based profiler, Photon has the Model 1740 NanoModeScan, which is also a dedicated, fully automated M² system using the NanoScan slit profiler to make the measurements according to the ISO 11146. The ISO method requires that the user input ten measurement points along the axis of propagation, five around the waist and five measurement points that are at least two Rayleigh ranges distal to the test lens. Once these have been set up, the NanoModeScan can make the entire M² measurement in as little as 20 seconds. The dedicated NanoModeScan software reports the M², the beam waist diameter and location, divergence, and the beam’s Rayleigh range for each axis. The NanoModeScan’s speed of analysis is due to the wide dynamic range of the NanoScan slit profiler, which does not require that the attenuation be changed during the measurement of both the waist and far-field areas of the beam propagation. The NanoModeScan can also determine the M² using the Rayleigh Method as a fully automated process. By selecting the Rayleigh method, the ModeScan will find the waist and then the Rayleigh points for both axes. It will then report the propagation parameters as with the ISO method. This method is fully automated and requires no intervention from the operator, other than the initial set up and input of the wavelength and lens parameters. It does take longer than the ISO method to make the measurements since it must find the waist and Rayleigh points on its own. The time required for the entire measurement is dependent on the laser being measured, but is usually no more than 2 or 3 minutes. It has the advantage of being fully automated and can be left to run while the operator does some other task. The NanoModeScan is available with the Silicon, Germanium, or Pyroelectric NanoScan profiler, making it the only system that can measure M² for lasers at any wavelength from <200nm to beyond 10.6μm. |
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| NanoModeScan Specifications | |
| Sensor/Detector | |
| Scan head Travel | 500mm |
| Optical Axis Height | 140-170mm |
| Horizontal Fine Adjustment | 19mm |
| Angular Fine Adjustment | ±2º vertical, ±1.4º horizontal |
| Standard Lenses | 200mm EFL, BK-7 plano-convex, Broadband AR Coated 400mm EFL, BK-7 plano-convex, Broadband AR Coated; UV through long IR lenses available |
| Optional Lens | 200mm FL fused silica for UV coated for wavelength of use 350mm FL fused silica for UV coated for wavelength of use 190mm FL IR lens for 10.6μm wavelength |
| Minimum Spot Size | See scan head specifications |
| Computer/Electrical | |
| Source Power | See scan head specifications |
| File Saving and Data Logging | Data files, ASCII Files |
| AC Power | 110V, 60Hz standard 220V, 50Hz optional |
| Communication | RS-232 Interface or USB to RS-232 adapter required |
| Mechanical (Dimensions in mm) | |
| NanoModeScan Linear Stage | 812 × 102 × 78 |
| Photon Motion Controller | 273 × 89 × 57 |
| Alignment Channel | 940 × 247 × 72 |
| Removable Light Shield | 787 × 777 × 110 |
| Weight | |
| NanoModeScan Linear Stage | 8.4kg |
| Photon Motion Controller | 1.5kg |
| Alignment Channel | 4.8kg |
| Item | Description | P/N | ||
| NanoModeScan M² Systems | ||||
| USB MSP-NS-Si/9/5 | Model 1740 ModeScan with NanoScan Silicon (Si ) Detector 9mm aperture 5μm slits Si detector, 63.5mm diameter head, 9mm entrance aperture, and matched pair of 5.0μm wide slits. Use from 190 to 1000nm wavelengths. | PH00233 | ||
| USB MSP-NS-Ge/9/5 | Model 1740 ModeScan with NanoScan Germanium (GE) Detector 9mm aperture 5.0μm slits. Germanium detector, 63.5mm diameter head, 9mm entrance aperture, and matched pair of 5.0μm wide slits. Use from 700nm to 1.8μm wavelength. | PH00234 | ||
| USB MSP-NS-Pyro/9/5 | Model 1740 ModeScan with NanoScan Pyroelectric Detector 9.0mm aperture 5μm slits. Pyroelectric detector, 63.5mm diameter head, 9mm entrance aperture, and matched pair of 5μm wide slits. | PH00235 | ||
| MSP-NS-Pyro/20/25 | Model 1740 ModeScan with Large aperture NanoScan Pyroelectric Detector 20mm aperture 25μm slits. Pyroelectric detector, 100mm diameter head, 20mm entrance aperture, and matched pair of 25μm wide slits. | PH00218 | ||
| USB MSP-HPNS/10/5 | Model 1740 ModeScan with HP NanoScan scanhead with 9mm Pyroelectric Detector 5μm slits, 100mm diameter head, 9 mm entrance aperture, and matched pair of 5μm wide slits; scanhead is fan cooled. | PH00236 | ||
| NanoModeScan Accessories | ||||
| LENS 200 UV-XXX | Optional 200mm quartz lens for use between 190–400nm wavelengths. | PH00090 | ||
| LENS 400 UV-XXX | Optional 400mm quartz lens for use between 190–400nm wavelengths. | PH00091 | ||
| LENS 190 10.6 | Optional 7.5-inch focal length lens for use at 10.6μm wavelength. | PH00092 | ||
| LENS 100 VIS | Optional 100 mm focal length lens for use 400–700nm wavelength. | PH00093 | ||
| LENS 100 NIR | Optional 100 mm focal length lens for use 650–1000 nm wavelength. | PH00094 | ||
| LENS 100 LIR | Optional 100 mm focal length lens for use 1000–1550nm wavelength. | PH00075 | ||
| CUSTOM LENS | Specify wavelength, focal length | PH00088 | ||
| Model 1740 | ModeScan Rail w/o scan head | PH00074 | ||
| 1740 LENS PREP | ModeScan custom lens | PH00076 | ||
| 1740 TRNG | ModeScan onsite operation training | PH00077 | ||
| Lens 400 2um | Optional 400mm focal length lens for use at @2µm wavelength | PH00224 | ||
| Lens 200mm VIS | Optional 200mm focal length lens for use 400-700nm wavelength | PH00237 | ||
| Lens 400mm VIS | Optional 400mm focal length lens for use 400-700nm wavelength | PH00238 | ||
| lens 200mm NIR | Optional 200mm focal length lens for use 650-1000nm wavelength | PH00239 | ||
| lens 400mm NIR | Optional 400mm focal length lens for use at 650-1000nm wavelength | PH00240 | ||
| Lens 200mm LIR | Optional 200mm focal length lens for use at 1000-1550nm wavelength | PH00241 | ||
| lens 400mm LIR | Optional 400mm focal length lens for use at 1000-1550nm wavelength | PH00242 | ||
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Beam Profilers Catalog 107 pages (8.12 MB ) |
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NanoModeScan Manual 82 pages (2.42 MB ) |
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