Publications

Slit-Based Profilers

Performance Test of Long Trace Profiler Part 5.1: Noise due to Laser Pointing Instability
by S. C. Irick, W. R. McKinney, D. Peterman, V. V. Yashchuk

The Misunderstood M²
by DERRICK PETERMAN, PHOTON INC.

Fiber lasers pose special challenges for beam profiling
by DERRICK PETERMAN

Diagnostic Technique for Real-Time Measurement of Optical and Scan Properties of Optical Printheads
by Jeffrey L. Guttman, Razvan Chirita, and Terri Au, Photon, Inc., San Jose, CA., USA

Scanning Slit Profiler for Characterizing Optical Assemblies
by Derrick Peterman, Ph.D., Sales Engineer at Photon Inc. For further information, call (408) 226-1000 or e-mail dpeterman@photon-inc.com.

Two-dimensional microlens arrays in silica-onsilicon planar lightwave circuit technology
by Alexei L. Glebov Lidu Huang Shinegori Aoki Michael G. Lee Kishio Yokouchi

Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers
by Jeffrey L. Guttman

A New Paradigm for Free-Space Optical Alignment of Telecom Devices
by Allen M. Cary, Jeffrey L. Guttman, John Fleischer

Manufacturing Low Insertion Loss Fiber-Lens Elements
by Derrick Peterman, Ph.D., John Fleischer and Dan C. Swain

Real-Time Scanning Goniometric Radiometer for Rapid Characterization of Laser Diodes and VCSELs
by Jeffrey L. Guttman, John M. Fleischer, and Allen M. Cary

A Novel Far-Field Scanning Technique for Rapid Measurement of Optical Fiber Parameters
by Jeffrey L. Guttman, Razvan Chirita, and Carmen D. Palsan

MODE FIELD DIAMETER AND EFFECTIVE AREA MEASUREMENT OF DISPERSION COMPENSATION OPTICAL DEVICES
by Hale R. Farley, Jeffrey L. Guttman, Razvan Chirita and Carmen D. Pâlsan

Camera-Based Profilers

SCIENTIFIC PUBLICATIONS 

Twenty watts of terahertz.
by Eric J. Lerner, The Industrial Physicist, April/May 2003, p.9, reprinted with permission

How many bits is enough?
by Larry Green and Carlos Roundy, OE Magazine, November 2002, p. 40, reprinted with permission

Pitfalls of beam profiling
by Larry Green, OE Magazine, March 2002, p. 48, reprinted with permission

Propagation Factor quantifies laser beam performance
by Carlos B. Roundy, Laser Focus World, December 1999, pp. 119-122, reprinted with permission

INDUSTRIAL PUBLICATION

Beam Analysis of a Nd:Yag Marking Laser
by Lawrence Green

Application Note Beam Profiling of UV Lasers

Performance monitoring saves time and money
by Lawrence Green, Laser Focus World, June 2002, pp. 71-73, reprinted with permission

On-Line Beam Performance Monitoring to Improve Laser Reliability and Performance
by Lawrence I Green, Presented at Photonics West, San Jose, CA, January 2002, reprinted with permission

Automation Comes to Beam Profiling
by Brent D. Johnson, Photonics Spectra, January 2002, p. 64, reprinted with permission

Monitoring the Process
by Larry Green, Photonics Spectra, June 2001, pp. 118-124, reprinted with permission

Automated Measurement tool enhances beam consistency
by Lawrence Green, Laser Focus World, March 2001, pp. 165-166, reprinted with permission

Monitoring Laser Beam Performance
by Lawrence Green, The Fabricator, February 2001, pp. 38-40, reprinted with permission

SPC helps evaluate laser beams
by Carlos B. Roundy, Industrial Laser Solutions, February 2000, pp. 15-17, reprinted with permission