Presentations

Slit-Based Profilers

LED Profiler

Characterization of the Near-Field Profile of Semiconductor Lasers and the Spot Size of Tightly Focused Laser Beams from Far-Field Measurements
By Jeffrey L. Guttman and John M. Fleischer

Mode-Field Diameter and "Spot Size" Measurements of Lensed and Tapered Specialty Fibers
By Jeffrey L. Guttman

A New Paradigm for Free-Space Optical Alignment of Telecom Devices
By Allen M. Cary, Jeffrey L. Guttman, John Fleischer

The Scanning Goniometric Radiometer: A Revolutionary Technique for Characterizing Divergent Light Sources: Laser Diodes, VCSELs, Optical Fibers, Waveguides, LEDs,…
By Jeffrey L. Guttman, Ph.D.