Scanning Slit Beam Profiling with NanoScan

Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.

Scanning Slit Beam Profiler For High Accuracy Dimensional Measurement
 
Download Data Sheet.
 
NanoScan 2s combines the convenience and portability of direct USB connectivity with the speed, accuracy, and dynamic range that users have come to expect from the Photon NanoScan slit based profilers. The NanoScan 2s is available with a silicon, germanium or pyroelectric detector, which allows it to profile lasers of any wavelength from UV to far infrared, out to 100μm and beyond. With the new NanoScan 2s software package, the user can configure the display interface however it is desired; displaying those results of most interest on one easy-to-read screen, or on multiple screens.
The NanoScan slit profiler is the most versatile laser beam profiling instrument available today: providing instantaneous feedback of beam parameters for CW and kilohertz pulsed lasers, with measurement update rates to 20Hz. The natural attenuation provided by the slit allows the measurement of many beams with little or no additional attenuation. The high dynamic range makes it possible to measure beams while adjustments to focus are made without having to adjust the profiler. Just aim the laser into the aperture and the system does the rest!
Scanning Slit Beam Profiler

Capabilities

NanoScan 2s is a PC-based instrument for the measurement and analysis of laser beam spatial irradiance profiles in accordance with the ISO standard 11146. The scan heads also measure power in accordance with ISO 13694. NanoScan uses the scanning slit, one of the ISO Standard scanning aperture techniques. It can measure beam sizes from microns to centimeters at beam powers from microwatts to over kilowatts, often without attenuation. Detector options allow measurement at wavelengths from the ultraviolet to the infrared.
The NanoScan 2s digital controller has 16-bit digitization of the signal for enhanced dynamic range up to 35dB power optical. With the accuracy and stability of the beam profile measurement you can measure beam size and beam pointing with a 3-sigma precision of several hundred nanometers. The software controllable scan speed and a "peak-connect" algorithm allows the measurement of pulsed and pulse width modulated lasers with frequencies of 10kHz and higher*. The NanoScan is also able to measure up to 16 beams, or regions of interest, in the aperture simultaneously.

Benefits

 Measure any wavelength from UV to very far infrared (190nm to >100μm)
 Instantaneous real time display of results; beam found in less than 300ms and updated at up to 20Hz
 Waist location can be determined to within ±25μm due to the well-defined Z-axis datum plane of the NanoScan
 Measure pulsed and CW lasers
 For pulsed beams the pulse rate is measured and reported
 From as small as 7μm beams, can be measured directly with guaranteed accuracy and precision
 Additional high signal to noise ratio can be achieved with averaging
 Z-axis caustic measurements are available with built-in mechanical linear stage control
 M2 propagation ratio values available with simple M2 Wizard included with the software.
 Any beam result can be charted and monitored over time
 Power levels can be monitored along with spatial measurements to determine if losses are introduced by beam adjustments
 Log results to text files for independent analysis
 Automate the system using optional ActiveX Automation commands, available with the PRO version software and scan heads
 Samples of automation programs included for Excel, VBA, LabView and Visual Basic.net
* The minimum frequency is a function of the beam size and the scan speed. This is a simple arithmetic relationship; there must be a sufficient number of pulses during the time that the slits sweep through the beam to generate a meaningful profile. Please refer to Photon's Application Note, Measuring Pulsed Beams with a Slit-Based Profiler.

NanoScan 2s Configurable User Interface

In addition to new hardware, the NanoScan 2s has an updated integrated software package for the Microsoft Windows Platform, which allows the user to display any of the results windows on one screen. The NanoScan 2s software comes in two versions, STD and PRO. The NanoScan 2s Pro version includes ActiveX automation for users who want to integrate the NanoScan into OEM systems or create their own user interface screens with C++, LabView, Excel or other OEM software packages.
NanoScan 2s Configurable User Interface
Example of display configuration window

Integrated Power Meter

The silicon and germanium detector equipped NanoScan 2s systems include an integrated 200mW power meter.
The scanhead comes with a quartz attenuator window that provides a uniform response across a broad wavelength range.
This is a relative power meter that has better than 1.5% correspondence when calibrated with a user-supplied power meter and used in the same configuration as calibrated.
The power meter screen in the software shows both the total power and the individual power in each of the beams being measured.
Integrated Power Meter

Available Detectors

The NanoScan 2s is available with silicon, germanium or pyroelectric detectors to cover the light spectrum from UV to very far infrared.

Apertures and Slits

The NanoScan 2s is available with a variety of apertures and slit sizes to allow for the accurate measurement of varying beam sizes. The slit width defines the minimum beam width that can be measured; due to convolution error, the slit should be no larger than ¼ the beam diameter to provide a ±3% accurate measurement. For this reason the minimum beam diameter measureable with the standard 5μm slit is 20μm. To measure beams smaller than 20μm it is necessary to use the small aperture 1.8μm slit instrument, providing a minimum beam diameter of ~8μm. Because these slits are so narrow, the maximum length limits the aperture to 3.5mm. Contrary to many people's beliefs, these smaller slits do not improve the resolution of the measurement, only the minimum size of the beam. Therefore, unless it is necessary to measure beams less than 20μm, one would be advised to stick with the 9mm/5μm configurations. For very large beams, NanoScan is available with a large 20 or 25mm aperture with 25μm slits. These sensor are larger than the standard scan heads (100mm diameter)
NanoScan 2s Scanhead Model Si/3.5/1.8μm Si/9/5μm Si/9/25μm
Wavelength 190nm - 950nm 190nm - 950nm 190nm - 950nm
Slit Size 1.8μm 5μm 25μm
Aperture Size 3.5mm 9mm 9mm
1/e² Beam Diameter Range 7μm-~2.3mm 20μm-~6mm 100μm-~6mm
Spatial Sampling Resolution 5.3nm-18.3μm
Profile Digitization 16-bit
Scan frequency 1.25, 2.5, 5, 10, 20Hz
Power Reading User calibrated
Power Aperture Window Metalized Quartz (200mW upper limit)
Laser Type CW or Pulsed
Operating Range See Operating Space Charts
Damage threshold See Operating Space Charts
Rotation Mount Standard
Scanhead Dimension 63.4mm diameter x76.8mm long
See Mechanical Drawing for details
NanoScan 2s Scanhead Model Ge/3.5/1.8μm Ge/9/5μm Ge/9/25μm
Wavelength 700nm - 1800nm 700nm - 1800nm 700nm - 1800nm
Slit Size 1.8μm 5μm 25μm
Aperture Size 3.5mm 9mm 9mm
1/e² Beam Diameter Range 7μm-~2.3mm 20μm-~6mm 100μm-~6mm
Spatial Sampling Resolution 5.3nm – 18.3μm
Profile Digitization 16 bit
Scan Frequency 1.25, 2.5, 5, 10, 20Hz
Power Reading User calibrated
Power Aperture Window Metalized Quartz (200mW upper limit)
Laser Type CW or Pulsed
Operating Range See Operating Space Chart
Damage Threshold See Operating Space Chart
Rotation Mount Standard
Scanhead Dimension 63.4mm diameter x 76.8mm long
See Mechanical Drawing for details
NanoScan 2s Scanhead Model Pyro/9/5μm Pyro/9/25μm
Wavelength 190nm->100μm 190nm->100μm
Slit Size 5μm 25μm
Aperture Size 9mm 9mm
1/e² Beam Diameter Range 20μm-~6mm 100μm-~6mm
Spatial Sampling Resolution 5.3nm-18.3 μm
Profile Digitization 16-bit
Scan Frequency 1.25, 2.5,5,10,20Hz
Power Reading Not available
Power Aperture Window N A
Laser Type CW or Pulsed
Operating Range See Operating Space Chart
Damage Threshold See Operating Space Chart
Rotation Mount Standard
Scanhead Dimension 63.4 mm diameter x 76.8mm long
See Mechanical Drawing for details

The Most Versatile and Flexible Beam Profiling System Available

With the available range of detectors, slit sizes and apertures the NanoScan 2s provides the maximum versatility in laser beam profiling. NanoScan 2s adds the convenience and portability of direct USB connectivity: no external controllers or power supplies required to operate the profiler. In addition the rotation mount has been redesigned to provide a stand for vertical operation, if desired. The mount can be positioned in one of two places. If vertical operation is desired the mount is positioned toward the back of the scanhead to expose the stand, which can be affixed to the optical table or stage. If standard horizontal operation is desired, then the rotation mount can be positioned in the forward configuration, maintaining the original length and size of the scanhead.

The Most Versatile and Flexible Beam Profiling System Available

See Your Beam As Never Before

The new NanoScan 2s graphical user interface (GUI) allows the user to set the display screens to any appropriate configuration, displaying those that are of interest and hiding what is not. This means that you can have the information that you want to see, uncluttered by extraneous output, and you can have all the features you need, visible at once. The screens can be docked or floating with ribbon bars for the controls that can be visible or hidden as desired. This allows you to take advantage of a large, multi-monitor desk top or maximize the useful information on a small laptop display.
See Your Beam As Never Before

Measured Beam Results

From 1989 through 1996, John Fleischer, founder and past President of Photon Inc., chaired the working laser beam width ISO/DIN committee that resulted in the ISO/DIN 11146 standard. The final approved standard, available in 13 languages. The standard governs profile measurements and analysis using scanning apertures, variable apertures, area sensors and detector arrays. NanoScan 2s measures spatial beam irradiance profiles using scanning slit techniques.
Results measured include:
Beam Width at standard and user-definable clip levels, including 1/e² and 4σ
Centroid Position
Peak Position
Ellipticity
Gaussian Fit
Beam Divergence
Beam Separation
Pointing Stability
ROI Power
Total Power
Pulsed Laser Repetition Rate
Measured Beam Results

M² Wizard

M-squared (M²) software Wizard is an interactive program for determining the "times diffraction limit" factor M² by the Rayleigh Method. The M² Wizard prompts and guides the user through a series of manual measurements and data entries required for calculating M². The Optional Rayleigh Range Translation Test Fixture (RAL-FXT) provides convenient translation of a NanoScan scanhead assembly and a digital readout of its relative position along the Z-axis. Used with a user-provided focusing lens and the M² Wizard in the NanoScan Analysis Software, this fixture offers a quick and easy method to determine the times-diffraction propagation factor (M²) of a laser. The RAL-FXT features a base plate, sliding carriage and digital micrometer. The base plate (5.4×10.2×0.38in.) provides a series of ¼-20 threaded mounting holes at 2in. centers to facilitate convenient fixturing of the assembly with respect to the focusing lens. The sliding carriage accommodates the combination of the 0.125-in. dowel pin and the ¼-20 mounting hole found on any Photon scan head's rotation mount, and enables smooth movement of the scan head assembly over a 6-in. range of travel. A Mitutoyo micrometer with a handy re-zeroing feature and accompanying slide provides precise determination of the scan head location and/or travel distance with a resolution of tens of microns. For automated and automatic M² measurements the NanoModeScan option is required.
M² Wizard

Pulsed Laser Beam Profiling

In addition to profiling CW laser beams, NanoScan can also profile pulsed laser beams with repetition rate in the 10kHz range and above. To enable the measurement of these pulsed lasers, the NanoScan profiler incorporates a "peak connect" algorithm and softwarecontrolled variable scan speed on all scanheads. The accuracy of the measurement generally depends on the laser beam spot size and the pulse-to-pulse repeatability of the laser. The NanoScan is ideal for measuring Q-switched lasers and lasers operating with pulse width modulation power (PWM) control. In the past few years, lasers with pico- and femtosecond pulse durations have begun to be used in many applications. Although these lasers add some additional complication to the measurement techniques, the NanoScan can also measure this class of laser.

NanoScan 2s – Professional Version

Automation Interface

For customer who want to incorporate the NanoScan 2s into an automated procedure or to create a customized user interface, the PRO version scanheads include an ActiveX Automation Server that can be used by an Automation Client written in Visual Basic for Applications (VBA), C/C++ or by an application which supports ActiveX Automation, such as Microsoft Excel, Microsoft Word or National Instruments' LabVIEW. The software package include example of programs written in Excel and LabVIEW in the automation folder.

Optional Collimation Fixture

Collimation is one of the most common applications for which the NanoScan 2s is used. The Collimation Fixture provides an easy and extremely accurate method for making this adjustment to a laser system. The Collimation Fixture comprises a test lens with the NanoScan 2s profiler positioned to measure the beam size at the geometric focus of the lens. From lens theory, the angle of collimation is determined by the equation:
Optional Collimation Fixture
where θ is the angle of collimation, Dƒ is the beam size measured at the lens focal length, and ƒ is the focal length of the lens. Once the beam size is measured at the focal length of the lens, simply dividing this measured beam size by the focal length determines the laser beam collimation angle. Practically speaking, adjusting the optics to generate the smallest Dƒ, will result in the minimum divergence angle. The beam profiler remains fixed, and active alignment is easily performed in real time. This level of simplicity, speed, and functionality is simply not possible with techniques involving multiple beam profile positions.
 
Divergence/Collimation test fixtures based on a high quality test lens to focus your collimated or diverging beam. Fixtures require a complete NanoScan System. Wavelength of use should be specified at time of order.
Optional Collimation Fixture
COL-FXT 250 Nominal 250mm focal length lens. Includes an enclosure to block stray light
COL-FXT 500 Nominal 500mm focal length lens. Includes an enclosure to block stray light
COL-FXT 250 TEL Nominal 250mm focal length lens. For wavelengths of use at 1310 or 1550nm with lens repositioning. Includes an enclosure to block stray light
COL-FXT C02 Zinc selenide (ZnSe) lens with a focal length of 190.5mm. For wavelength of use at 10.6m. Includes an enclosure that holds an adjustable entrance iris. Requires a Pyro NanoScan System

 

NanoScan 2s Acquisition and Analysis Software

Use the Software specification from the existing NanoScan 2s data sheet
*FeatureNanoScan StandardNanoScan Professional (all features in Standard plus)
Controls
SourceScanHead Select, Gain, Filter, Sampling Resolution, AutoFind, Rotation Frequency, Record Mode 
CaptureAveraging, Rotation, Magnification, CW or Pulse Modes, Divergence, Gaussian Fit, Reference Position, Recompute 
Regions of Interest (ROI)Single or Multiple, Automatic or Manual, Colors 
ProfilesVertical Scale (1´, 10´, 100´), Logarithmic Scale, Z & PAN (Automatic or Manual) 
Computation: ISO 13694, ISO 11146Dslit, (13.5%, 50% 2 User Selectable Clip Levels), D4Ó, Width ratios, Centroid Position, Peak Position, Centroid Separation, Peak Separation, Irradiance, Gaussian Fit, Ellipticity, Divergence, Total Power, Pulse Frequency, % power 
 Continuous, Rolling, Finite 
PointingCentroid or Peak, Accumulate Mode, Beam Indicator, Graph Center, Colors 
2D/3D2D or 3D Mode, Linear or Logarithmic Scale, Resolution, Fill Contours, Solid Surface, or Wireframe, Clip Level Colors 
ChartsChart Select, Parameter Select, Aperture Select, Update Rate, Start and Clear 
LoggingFile Path/Name, Delimiter, Update Rate 
Rail Setup: Com Port and Length, Connect/Disconnect, Rail Control 
Views
ProfilesDisplays Beam Profiles for each axis, with optional Gaussian Overlays 
ResultsDisplays Values and Statistics for Selected results 
PointingDisplays the XY position of the Centroid or Peak for each ROI , with optional overlays and Accumulate Mode 
ChartsDisplays Time Charts for User-selected results 
2D/3DDisplays pseudo 2D/3D Beam Profile 
Wizard An interactive procedure for measuring M² by the Rayleigh Method 
File Saving
NanoScan Data Files 
Text Files 
Data Logging
Log to File 
Reports
NanoScan Report 
Automation Interface
ActiveX Automation Server 
Minimum System Requirements
PC computer running windows 7 (32/64) Laptop or Desktop¹  
A dual core processor CPU, 2GHz or better  
2GB of RAM²  
1-USB 2.0 port available  
At least 250MB of free HDD space  
1400 x 900 display resolution or better  
Graphics card w/hardware accelerator  
DVD-ROM drive  
Microsoft compatible pointing devices(e.g., mouse, trackball, etc)  
*Download the NanoScan Acquisition and Analysis Software Manual for a complete description of all Software Features
¹ A business/professional version of windows is recommended. The NanoScan v2 software has not been tested with home versions of Windows. Both 64-bit and 32-bit versions of Windows 7 are supported. NanoScan v2 is no longer tested on Windows XP 32-bit operating systems.
² The computer memory (RAM) will affect the performance of the software in the Data Recorder.
 

Specifications

ModelGeneral Specification
Bus interfaceUSB 2.0
Signal digitization16bit
Maximum digitization clock20MHz
Maximum update rate20Hz
Data transferBulk Transfer Mode
On-board memory64MB mDDR SDRAM
Weight434g (15.3 ounces)
Operating temperature0…50°C
Humidity90%, non-condensing
Scanhead Dimensions3.03"(7.68cm) L X 2.5"(6.35cm) Ø
Power USB2.0 Bus Powered
CPU Clock300MHz
Memory Clock264MHz
Scanning MotorBrushed DC, 4W max

Mechanical Dimensions
NanoScan 2s Standard Scanhead: NS2-Si, NS2-Ge and NS2-Pyro

Mechanical Dimensions
 

Typical NanoScan Operating Space Charts

Operating Range is at Peak Sensitivity of Detector. Operating Space is NOT absolute.
THESE CHARTS TO BE USED AS A GUIDE ONLY.
Silicon Detector

Silicon Detector

Silicon Detector: Responsivity varies with wavelength. Detects between 190-950nm. Peak responsivity is 0.4 amps/watt at 850nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1)/ contact the factory.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyrodetectors are not blackened.
Slit Damage ( ): where one can begin to cut the slits. Refer to Photon's Damage Threshold with High Power Laser Measurements document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.
Germanium Detector

Germanium Detector

Responsivity: Detector conversion constant, incident photons to a current.
Detector: Responsivity varies with wavelength. Detects between 700-1800nm. Peak responsivity is 0.7 amps/watt at 1550nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1) contact the factory.
Beam Diameter: Circular laser spot being measured by a narrow slit. Clip level method.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyro detectors are not blackened.
Slit Damage ( ): Power density (watts/cm2) where one can begin to cut the slits. Refer to Photon's Aperture Damage due to High Incident Power document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.
Pyroelectric / 9mm / 5μm

Pyroelectric / 9mm / 5μm

Responsivity: Detector conversion constant, incident photons to a current.
Detector: Responsivity varies with wavelength. Detects between 700-1800nm. Peak responsivity is 0.7 amps/watt at 1550nm. Detector to detector responsivity variation can be as great as ±20%.
Power: Power in the measured laser beam. Assumes a round beam diameter. An elliptic beam can be approximated by using the maximum width dimension and assuming all the energy is in a beam of this diameter. For extremely elliptic beams (ratio >4:1) contact the factory.
Beam Diameter: Circular laser spot being measured by a narrow slit. Clip level method.
Pulsed Operation ( ): Upper limit of the operating space for pulsed laser measurements.
Black Coating Removed ( ): Slits are blackened to reduce back reflections; blackening begins to vaporize near this line. Slits in pyro detectors are not blackened.
Slit Damage ( ): Power density (watts/cm2) where one can begin to cut the slits. Refer to Photon's Aperture Damage due to High Incident Power document.
Left Boundary: Smallest beam size limited to 4-5 times the slit width. Some models have another limit due to electrical bandwidth.
Right Boundary: Instrument entrance aperture. The largest beam width (1/e2) will be the aperture divided by 1.2-1.4.

 

  • Download NanoScan Standard
    NanoScan Standard is our full-function software with a extensive set of NIST traceable ISO beam width and roundness, beam position, and M2 measurements and a customizable under interface with the ease-of-use and flexibility that customers have come to expect.
  • Download NanoScan Professional
    NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.